Quality Digest Live -- January 29, 2016

Story links for January 29, 2016

 

Lighting the Way Toward Better Measurements

You Wouldn't Recognize This Company

Building Comprehensive Quality Capabilities
Plus: An interview with Joe Humm, vice president, global sales operations, Sparta Systems


Process Excellence Makes Sales Problems Solvable

Tech Corner: traqpath, an EtQ product

 

Quality Digest Live -- January 15, 2016

Story links for January 15, 2016

 

New Kid in the C-Suite

Improving Gun Safety With Force Measurement

Lean, Quality, and Risk-Based Thinking in ISO 9001:2015
Plus: An interview with Mike Micklewright, lean trainer and consultant

The Wait Is Over

CMSC Corner: Interview with Ron Hicks, president of Automated Precision Inc. (API)
For more information on PrecisionPath Consortium contact Ron Hicks at ron.hicks@apisensor.com

 

Carl Zeiss Microscopy’s picture

By: Carl Zeiss Microscopy

(Carl Zeiss: Oberkochen, Germany) -- Carl Zeiss, a leading global provider of electron- and ion-beam imaging and analysis solutions, presents its newly developed line of corrected LIBRA 200 transmission electron microscopes (TEM).

Two different configurations are offered.

 
Aberration free high resolution imaging of a YAG crystal interface at 200 kV.
[Courtesy of Katharina Hartmann, GFZ German Research Center for Geoscienes, Potsdam.]

Belinda Jones’s picture

By: Belinda Jones

This year marks the 25th anniversary of the Coordinate Metrology Systems Conference (CMSC), a notable accomplishment for any organization fueled by volunteers. Hosted by the Coordinate Metrology Society, the 2009 Conference was held at the Marriott downtown in Louisville, Kentucky. Even with the economic downturn, the event held its own with visitors traveling from Switzerland, Italy, France, Germany, Australia, Japan, Canada, United Kingdom, United States, and more.

History of the CMSC
In 1984, a small group of ASPRS/ACSM (American Society of Photogrammetry and Remote Sensing/American Congress of Surveying and Mapping) attendees gathered in San Antonio, Texas. They expressed concern that their measurement problems were not being addressed by the rest of the surveying and photogrammetry community. This occasion marked the beginning of the CMSC.

 

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