Donald J. Wheeler
Short Run SPC, Part 1 and Part 2 showed how to use zed charts and difference charts to track the underlying process while making different products. This part will illustrate both the...
Donald J. Wheeler
Lean production is built on the explicit assumption that each step is operated predictably and capably. Predictable operation can only be achieved and maintained by using process behavior charts. But...
Donald J. Wheeler
Lean production is built on the explicit assumption that each step is operated predictably and capably. Predictable operation can only be achieved and maintained by using process behavior charts...
Donald J. Wheeler
In the past two months we have looked at how three-sigma limits work with skewed data. This column finds the power functions for the probability limits of phase two charts with skewed probability...
Donald J. Wheeler
Last month I looked at how the fixed-width limits of a process behavior chart filter out virtually all of the routine variation regardless of the shape of the histogram. In this column I will look at...
Donald J. Wheeler
The oldest myth about process behavior charts is the myth that they require “normally distributed data.” If you have ever heard this idea, or if you have ever taught this to others, then you need to...
Donald J. Wheeler
Recently I have had several questions about which bias correction factors to use when working with industrial data. Some books use one formula, other books use another, and the software may use a...
Donald J. Wheeler
During the past three months James Beagle and I presented columns that made extensive use of analysis of means techniques. Since these techniques may be new to some, this column explains when to use...
Donald J. Wheeler
In Parts One and Two we defined the equivalence of instruments in terms of bias and measurement error based on studies using a single standard. Here we look at comparing instruments for differences...
Donald J. Wheeler
Last month we provided an operational definition of when measurement systems are equivalent in terms of bias. Here we will look at comparing the within-instrument measurement error between two or...
