Story links for Dec. 6, 2019

On this QDL, we look at gut reactions. The advice we have all received (and maybe given) about “just trust your instincts” or “go with your intuition.”  Dr. Gleb Tsipursky tells us why your “gut” may not be the best thing to rely on when making business decisions.

Book: "Never Go With Your Gut: How Pioneering Leaders Make the Best Decisions and Avoid Business Disasters"

Story links for Nov. 22, 2019

We talk to Nicholas Wyman, CEO and founder of IWSI America, about apprenticeship programs and how they are helping address today's skilled-labor shortages.

Report: It’s Time: Using Modern Apprenticeships to Reskill America. 

Story links for Nov. 15, 2019

What are strategic teams and how do they help your company achieve its strategic goals? Dan Wolf, author of “Strategic Teams and Development: The fieldbook for People Making Strategy Happen,” will tell us what makes a good strategic team.  

Story links for Nov. 8, 2019

Manufacturers' wish list

The PrecisionPath Consortium looks at future metrology needs for today's increasingly complex manufacturing industry.

Based on data analysis and an industry survey, "Technology Roadmap for Large Scale Manufacturing" outlines trends that cut across multiple 3D measurement technology families.

Story links for Oct. 25, 2019

Story links for Oct. 18, 2019

Story links for Oct. 11, 2019

Join us for a look at Brunson Instrument's amazing 220,000 square feet cave where they design and manufacture their state-of-the-art metrology equipment.

Story links for Sept. 27, 2019

Changing the face of engineering

Michelle Edwards, chair of the Women in Metrology committee for the Coordinate Metrology Society, talks about women in engineering, and the importance of diversity.

Story links for Sept. 25, 2019

Chad Kymal, CTO of Omnex Inc., talks about how technological developments are causing changes to auto standards, methodologies, and the QMS.

Story links for Sept. 20, 2019

This is not your father's SEM

This week on Tech Corner we look at the JEOL NeoScope (JCM-7000) scanning electron microscope from Nikon Metrology. Auto functions, stage automation, and software enable easy sample imaging and elemental analysis.