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This Week in Quality Digest Live
Customer Care Features
Jim Benson
Lean and agile fail because we teach lean and agile
Michael Baxter
GaMEP helped Project Open Hand reduce the time it takes to prep a meal from 45 minutes to one
Knowledge at Wharton
Traditional measuring methods are no longer sufficient
Clinton Ballew
A trending quality-of-care issue
Patrick Moorhead
Quality impacts the overall cost of a product and should be part of value-pricing data

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Customer Care News
Chick-fil-A leads; Chipotle Mexican Grill stabilizes
Consolidated Edison posts large gain; patient satisfaction is stable
Partnership for a Cleaner Environment (PACE) program has grown to more than 40 suppliers in 40 countries
Trader Joe’s tops supermarkets; Home Depot overtakes Lowe’s
TVs and video players lead the pack, with internet services at the bottom
AIAG’s director of corporate responsibility comments on impact of new ethics language in upcoming IATF 16949
Good news for Detroit
The Baldrige Criteria for Performance Excellence can help
ISO/PC 303 project committee will provide international benchmarks to reduce purchasing risks

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QDL Tech Corner: JEOL NeoScope Scanning Electron Microscope

Video Information

Story links for Sept. 20, 2019

 

This is not your father's SEM

This week on Tech Corner we look at the JEOL NeoScope (JCM-7000) scanning electron microscope from Nikon Metrology. Auto functions, stage automation, and software enable easy sample imaging and elemental analysis.

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