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All News

Address Counterfeit Drug ID in the Field
(Spectral Evolution: Lawrence, MA) -- The worldwide counterfeit drug market continues to expand, both in developing and developed countries. From fake antimalarial drugs in Africa to counterfeits sold over the Internet, these drugs are detrimental in three primary ways: • Patients don’t receive the…
Brunson to Exhibit Portable Metrology Products at the 2013 CMSC
(Brunson: Kansas City, MO) -- Brunson Instrument Co., manufacturer and provider of 3D measurement and alignment solutions, will exhibit their portable metrology accessories at the 29th annual Coordinate Metrology Systems Conference (CMSC), which runs July 22–25, 2013, in San Diego. This conference…
CMSC 2013 Will Include 3D Metrology Career Fair, USS Midway Museum Tour
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) announced its final schedule of events for the 29th annual Coordinate Metrology Systems Conference (CMSC) from July 22–26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego. The conference is known for its superior slate of…
Quantum Dot Technique Combines Optical and Electron Microscopy
Researchers working at the National Institute of Standards and Technology (NIST) have developed a new microscopy technique that uses a process similar to how an old tube television produces a picture—called cathodoluminescence—to image nanoscale features. Combining the best features of optical and…
Microscopy Technique Could Help Develop 3D Computer Components
A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to monitoring the next generation of computer-chip circuit components, potentially providing the semiconductor industry with a crucial tool…
V-CAD Rapid Produces Measurements in Seconds
(Schneider Messtechnik, Bad Kreuznach, Germany) -- Schneider Messtechnik, a leading company in the field of production measurement technology, has launched V-CAD rapid, a 2D optical measuring device that is both mobile and compact. “Thanks to the intuition-based user interface of the M3 measuring…
Paul N. Gardner Releases Three Paint and Coating Testing Applicators
(Paul N. Gardner: Pompano Beach, FL) -- Paul N. Gardner Co. recently released three products for testing paints and coatings: an anti-sag meter, multiple clearance square applicator, and a stainless-steel bar film applicators. Anti-sag meter Coatings applied on nonhorizontal surfaces will sag due…
DCS to Roll Out New Integration for High-End Visualization
(Dimensional Control Systems: Troy, MI) -- Dimensional Control Systems (DCS), developer of variation analysis and quality management system software and provider of engineering services, is presenting at RTT Excite 2013 June 20–21, 2013, at RTT’s (developer of unique solutions for product…
VERSE Solutions Announces Cloud-Based Quality Management Solution
(Verse Solutions: Farmingdale, NY) -- VERSE Solutions has launch its cloud-based quality management solution targeted specifically for small to midsized businesses. VERSE is a web-based software as a service (SaaS) solution that has been developed to give companies flexible quality management…
Hexagon Metrology Launches Optiv Classic 443 tp
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has announced the release of the Optiv Classic 443 tp coordinate measuring machine (CMM), the newest model in the Optiv Classic series. The unit comes touch-trigger probe ready and includes a high-resolution color CCD camera for…
Full House at 29th Annual CMSC
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has filled all 27 speaker slots at the 2013 Coordinate Metrology Systems Conference (CMSC) scheduled for July 22–26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego, California. Each year, the event attracts hundreds of 3D…
Inspection Arsenal Loc-N-Load CMM Clamps
(Kay-Jay Products: Boylston, MA) -- Kay-Jay Products is on a mission to change the way you think about CMM inspection setups. Imagine an alternative line of CMM clamps and interchangeable CMM fixture plates designed to create a lean quality-control department, all with a very affordable price tag…
ATOS Core Series: Ultra-Compact Powerhouse
(Costa Mesa, CA) -- The ATOS Core series is the newest addition to the ATOS product line of advanced 3D scanners engineered by optical metrology systems expert GOM in Braunschweig, Germany. The ATOS Core is truly a mini-powerhouse. It fuses the latest 3D scanning technology and intelligent…
All-in-One Microscope for Advanced Imaging, Recording, and Measurement
(Keyence Corp. of America: Itasca, IL) -- Building on its extensive microscope lineup, Keyence Corp. has released a new multipurpose microscope. The VHX-700F allows users to leverage some of the advanced functions of the VHX Series, such as depth composition and 3D display, while offering the same…
Hexagon Metrology Launches PC-DMIS 2013 at HxGN LIVE
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has announced the launch of PC-DMIS 2013, a significant development release of the world’s most popular metrology software. PC-DMIS focuses on the collection, evaluation, management, and presentation of manufacturing data to reduce…
Hexagon Metrology Announces PC-DMIS Touch
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has introduced PC-DMIS Touch, a revolutionary measurement software for portable arm and DCC CMMs. Utilizing high-resolution multi-touch display technology, users physically interact with measurement sequences, feature variables, and…
Open Beta Program for CAPA and Action-Item Management System
(Source4Quality: Morgantown, PA) -- Source4Quality has announced an open beta program for its corrective and preventive action and action-item management system (CAPA-AIMS). Designed with small to midsized organizations in mind, CAPA-AIMS delivers an all-in-one, organizationwide, integrated, web-…
Don’t Miss the NACMA @ NIST Workshop and Conference
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting and co-organizing the 2013 North American Coordinate Metrology Association (NACMA) meeting, Aug. 27–30, 2013, at NIST in Gaithersburg, Maryland. The NACMA @ NIST conference is focused on training for…
Don’t Miss the NACMA @ NIST Workshop and Conference
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting and co-organizing the 2013 North American Coordinate Metrology Association (NACMA) meeting, Aug. 27–30, 2013, at NIST in Gaithersburg, Maryland. The NACMA @ NIST conference is focused on training for…
Hexagon Metrology Unveils eLearning Portal HexagonMetrologyU
(Hexagon: North Kingstown, RI) -- Hexagon Metrology today officially unveiled HexagonMetrologyU, the first e-learning portal designed to engage and support the metrology industry. The interactive platform debuts over 30 online courses covering metrology fundamentals, basic and intermediate…
HandHeld Scanner Helps Production of Aluminum Die Castings
(NVision: Coppell, TX) -- Lighting Science uses the HandHeld laser scanner from NVision to ensure the dimensional integrity of the extremely complicated castings it purchases and uses in its roadway light emitting diode (LED) fixtures. In the past, it was difficult to inspect the castings because…
The 7th BYK-Gardner User Meeting
(BYK-Gardner USA: Columbia, MD) -- BYK-Gardner USA is a member of the BYK Additives & Instruments division of ALTANA. BYK-Gardner, a manufacturer and distributor of quality control instruments for color, appearance, and physical properties testing, will hold the 7th BYK-Gardner user meeting, “…
Along Comes the Spider
(Artec: Palo Alto, CA) -- Artec, developer of 3D scanning and 3D facial recognition technology has announced a new generation handheld, 3D scanner—Spider—named for its many “eyes.” Unlike other handheld scanners, Spider has been developed for scanning objects with many small details, such as…
The Library of Congress Issues ISSN for the Journal of the CMSC
(Coordinate Metrology Society: San Diego) -- The Coordinate Metrology Society (CMS) recently announced the Library of Congress has issued ISSN numbers for the print and online versions of The Journal of the CMSC. ISSN 2328-6067 has been assigned to the print version of The Journal of the CMSC, and…
Jim Harrington Awarded Honorary Ph.D. Degree
(Quality Digest: Chico, CA) -- On April 16, 2013, Quality Digest columnist H. James Harrington was presented with an honorary degree of Doctor of Philosophy from the Sudan Academy of Sciences. The Ph.D. was conferred on Harrington for his immense contributions, remarkable achievements, and…

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