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The Dirt on Ford’s 3D Dirt-Detection Technology
(Ford Motor Co.: Dearborn, MI) -- The new F-Series trucks are the latest vehicles to benefit from Ford Motor Co.’s new dirt-detection technology to ensure optimal paint and surface quality. The system uses high-resolution cameras and reflected light to digitally identify surface imperfections finer…
1factory Launches Online Platform for Simplifying Supplier Quality Management
(1factory: San Jose, CA) -- 1factory, Inc. has launch an online supplier quality management platform that enables buyers to implement quality controls, access inspection and process capability (Cp, Cpk) data, and collaborate with suppliers to improve manufacturing processes across the supply chain…
Hexagon Metrology Unveils E-Learning Portal: HexagonMetrologyU
(Hexagon: North Kingstown, RI) -- Hexagon Metrology has officially unveiled HexagonMetrologyU, the first e-learning portal designed to engage and support the metrology industry. The interactive platform debuts more than 30 online courses covering metrology fundamentals, basic and intermediate…
FARO Proudly Supports America’s Own Corvette Racing Team
(FARO: Lake Mary, FL) -- FARO Technologies Inc., the world’s most trusted source for 3D measurement technology, was the proud sponsor of Chevrolet’s Corvette Racing Team, campaigned by Pratt & Miller Engineering, that raced in the 90th running of the 24 Hours of Le Mans, June 23–24, 2013, in Le…
SpatialAnalyzer Is Coming to a City Near You
(New River Kinematics: Williamsburg, VA) — Beginning September 2013, SpatialAnalyzer (SA), the portable metrology solution for large-scale manufacturers, is coming to a city near you. Attend a free SA user seminar at one of 16 cities around the United States and learn more about how SA can help you…
H1 2013 Financial Results: Creaform is in Excellent Shape
(Creaform: Lévis, Québec, Canada) -- Creaform, developer, manufacturer, and provider of portable 3-D measurement solutions and 3D engineering services, has announced its financial results for the first half of 2013. The company reports sales growth of 41 percent over 2012. “We are extremely happy…
Brunson Unveils Website and Mobile App
(Brunson: Kansas City, MO) -- Brunson Instrument Co. has unveiled their newly redesigned website with detailed product descriptions and photos, featured videos, company news and more. The company also rolled out their new mobile website application at m.brunson.us. The websites cater to alignment,…
Basis Releases IR Edition of Surphaser 100HSX Laser Scanner
(Basis Software: Redmond, WA) -- Basis Software Inc., designer, marketer, and supplier of 3D laser scanning systems and products, released the “IR” version of the Surphaser 100HSX, their latest phase-shift, hemispherical laser scanner at the 2013 Coordinate Metrology Systems Conference (CSMC) held…
Verisurf Announces 7th Generation of X Software
(Verisurf: Anaheim, CA) -- Verisurf Software Inc., developer of metrology software, has released the 7th generation of its Verisurf X software. With model-based geometric dimensioning and tolerancing (GD&T) inspection technology at its core, the all-new computer-aided inspection, reverse…
Omnitrac 2 Made Its U.S. Debut at CMSC 2013
(API: Rockville, MD) -- Automated Precision Inc. presented the North American debut of the Omnitrac 2, the world’s first completely wireless laser tracker, at the Coordinate Metrology Systems Conference (CMSC) held last month in San Diego. In addition demonstrating the Omnitrac 2’s Absolute…
NVision Saves Clients Time and Money with Consulting-First Approach
(August 2013) - NVision, the leader in non-contact optical scanning, announced that its technology consulting philosophy has been successful in saving time and money for companies in need of 3D scanning. "Unfortunately, most companies just want to focus on selling their scanning equipment or their…
Sequence Enterprise Work Instruction Software v. 3.0 Released
(FFD Inc.) -- FFD Inc. announces the release of Sequence Enterprise Work Instruction Software v3.0. “This new version of Sequence is specifically focused on the operational needs of manufacturing companies that not only need to securely validate and capture information about how their products are…
Coordinate Metrology Systems Conference (CMSC) 2013 Brims with 3D Measurement Innovations and Information
(CMSC: Benbrook, TX ) -- The Coordinate Metrology Society announced today its 29th annual Coordinate Metrology Systems Conference (CMSC) attracted more than 500 professionals worldwide in the 3D portable measurement and inspection field. CMSC 2013 was held July 22-26, 2013 at the Sheraton San Diego…
Meggitt Sensing to Exhibit Endevco Sensors at NI Week Conference
(Meggitt Sensing: Irvine, CA) -- Meggitt Sensing Systems, a Meggitt company and leader in sensing and monitoring systems for extreme environments, will be highlighting its Endevco line of sensors at the upcoming NIWeek conference Aug. 5–8, 2013, at the Austin, Texas, Convention Center. The Meggitt…
NICE Survey Highlights Opportunities to Engage Service Workers
(NICE: Ra'anana, Israel) -- NICE Systems, developer of analytic software, has announced that a benchmark study on trends and best practices in frontline performance management indicates that a majority of companies do not use collaboration and gamification to improve employee engagement. Only 12…
<em>The Lean Six Sigma Black Belt Handbook</em>
(CRC Press) -- Although Lean and Six Sigma appear to be quite different, when used together they have shown to deliver unprecedented improvements to quality and profitability. The Lean Six Sigma Black Belt Handbook: Tools and Methods for Process Acceleration explains how to integrate these…
Book Discount Available for NACMA Conference Attendees
(NIST: Gaithersburg, MD) -- National Institute of Standards and Technology (NIST) authors and CRC Press have arranged to give all attendees at the 2013 North American Coordinate Metrology Association (NACMA) conference a 20-percent discount on the definitive coordinate metrology book, Coordinate…
Distance Measurement Sensors From SICK Offer Increased Mounting Flexibility
(SICK: Minneapolis) -- SICK, one of the world’s leading manufacturers of sensors, safety systems, machine vision, encoders, and automatic identification products for factory and logistics automation, has launched the Dx35 line of laser distance measurement sensors. These mid-range distance…
New METTLER TOLEDO Microsite
(METTLER TOLEDO: Columbus, OH) -- METTLER TOLEDO’s Good Weighing Practice (GWP) was introduced in 2007 and presents a scientific approach to safe selection, calibration and operation of weighing equipment. Now, for the first time, that knowledge is open to the users across several different…
Address Counterfeit Drug ID in the Field
(Spectral Evolution: Lawrence, MA) -- The worldwide counterfeit drug market continues to expand, both in developing and developed countries. From fake antimalarial drugs in Africa to counterfeits sold over the Internet, these drugs are detrimental in three primary ways: • Patients don’t receive the…
Brunson to Exhibit Portable Metrology Products at the 2013 CMSC
(Brunson: Kansas City, MO) -- Brunson Instrument Co., manufacturer and provider of 3D measurement and alignment solutions, will exhibit their portable metrology accessories at the 29th annual Coordinate Metrology Systems Conference (CMSC), which runs July 22–25, 2013, in San Diego. This conference…
CMSC 2013 Will Include 3D Metrology Career Fair, USS Midway Museum Tour
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) announced its final schedule of events for the 29th annual Coordinate Metrology Systems Conference (CMSC) from July 22–26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego. The conference is known for its superior slate of…
Quantum Dot Technique Combines Optical and Electron Microscopy
Researchers working at the National Institute of Standards and Technology (NIST) have developed a new microscopy technique that uses a process similar to how an old tube television produces a picture—called cathodoluminescence—to image nanoscale features. Combining the best features of optical and…
Microscopy Technique Could Help Develop 3D Computer Components
A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to monitoring the next generation of computer-chip circuit components, potentially providing the semiconductor industry with a crucial tool…
V-CAD Rapid Produces Measurements in Seconds
(Schneider Messtechnik, Bad Kreuznach, Germany) -- Schneider Messtechnik, a leading company in the field of production measurement technology, has launched V-CAD rapid, a 2D optical measuring device that is both mobile and compact. “Thanks to the intuition-based user interface of the M3 measuring…

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