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AIMS Metrology Receives Grant To Develop New CMM Technology

Probe configurations will allow personnel with minimal training to operate CMMs

AIMS Metrology
Tue, 08/02/2016 - 10:35
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(AIMS: Miamisburg, OH) -- Advanced Industrial Measurement Systems (AIMS) Metrology, in collaboration with FASTLANE, an Ohio Manufacturing Extension Partnership affiliate of the University of Dayton Research Institute and SK Mold and Tool, has been awarded a $100,000 grant to develop new vision and image recognition technology for its coordinate measuring machines (CMMs).

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With the new camera system, CMM operators will be able to build probe configurations with a higher degree of reliability. CMM setup time is also expected to be reduced from 30 minutes to 3 minutes per part, saving manufacturers approximately two hours per shift.

“Operator error will be eliminated,” says AIMS president Dave Delph. “We have developed a camera feature with very high resolution that will use an interface we create to verify probe parameters such as stylus size and extension before the instrument is released to inspect parts. Operators will also be able to use the camera system to set up probe configurations allowing personnel with minimal training to operate CMMs.”

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