Deterring identity fraud
NEPATEC 2.0 captures and curates environmental review data
Boosts global compliance capabilities
Four related algorithms are ready for use to protect data created and transmitted by the internet of things and other electronics
New method will be useful in nanomedicine, food science, environmental science, and advanced manufacturing
All-in-one solution empowers diverse creators
Oct. 27–28, 2025, DoubleTree by Hilton, Manchester, New Hampshire
ZEISS acquires all equity shares of Pi Imaging Technology
Convanit will advance AI-powered image analytics in smart manufacturing
Application-specific programs account for energy efficiency, robustness, and more
A risk-based approach to cybersecurity
How short-term sourcing fluctuations fit in the big picture
Using EDMIS advanced 5-axis MVi5 3D Metrology Center
Program continues to gain momentum in 2025
Offering customized turnkey solutions for inspections
Communities keep expanding opportunities in cybersecurity work and learning
An industry-first view of enterprise risk status
Compact tabletop machines deliver high-precision materials testing
Bridging the gap between 2D-inspection quality requirements planning and 3D metrology
Will cover charge making, processing, ladle room, and the melt deck