Nikon Metrology intends to focus on noncontact metrology
L1 force line enables fast, versatile testing for a basic production and inspection
Manufacturing leaders in design and engineering, production and metrology sought for Las Vegas event
Design structure allows for progressive, efficient, and practical measurements
MIL RA Alignment Modules feature low profile 3/8 in. rugged laser housing with a M12 connector
Calculates wafer thickness across X/Y points to resolution and repeatability of 0.00025 mm/0.00001 in.
Extended travel AV450 offers maximum throughput and versatility for repetitive, large-part inspection
Four times faster data acquisition, enabling precise measurement at the submicron level
Caters to the growing need for sophisticated scanning in an entry-level solution that is budget friendly
Topics for the Go Forth and Measure project are virtually unlimited
Ask questions, exchange ideas and best practices, share product tips, discuss challenges in quality improvement initiatives
Berkeley Lab and Magic Leap Inc. scientists create widely controllable ultra thin optical components
Designed for coordinate measuring machine inspection
