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All News

SpatialAnalyzer Is Coming to a City Near You
(New River Kinematics: Williamsburg, VA) — Beginning September 2013, SpatialAnalyzer (SA), the portable metrology solution for large-scale manufacturers, is coming to a city near you. Attend a free SA user seminar at one of 16 cities around the United States and learn more about how SA can help you…
H1 2013 Financial Results: Creaform is in Excellent Shape
(Creaform: Lévis, Québec, Canada) -- Creaform, developer, manufacturer, and provider of portable 3-D measurement solutions and 3D engineering services, has announced its financial results for the first half of 2013. The company reports sales growth of 41 percent over 2012. “We are extremely happy…
Brunson Unveils Website and Mobile App
(Brunson: Kansas City, MO) -- Brunson Instrument Co. has unveiled their newly redesigned website with detailed product descriptions and photos, featured videos, company news and more. The company also rolled out their new mobile website application at m.brunson.us. The websites cater to alignment,…
Basis Releases IR Edition of Surphaser 100HSX Laser Scanner
(Basis Software: Redmond, WA) -- Basis Software Inc., designer, marketer, and supplier of 3D laser scanning systems and products, released the “IR” version of the Surphaser 100HSX, their latest phase-shift, hemispherical laser scanner at the 2013 Coordinate Metrology Systems Conference (CSMC) held…
Verisurf Announces 7th Generation of X Software
(Verisurf: Anaheim, CA) -- Verisurf Software Inc., developer of metrology software, has released the 7th generation of its Verisurf X software. With model-based geometric dimensioning and tolerancing (GD&T) inspection technology at its core, the all-new computer-aided inspection, reverse…
Omnitrac 2 Made Its U.S. Debut at CMSC 2013
(API: Rockville, MD) -- Automated Precision Inc. presented the North American debut of the Omnitrac 2, the world’s first completely wireless laser tracker, at the Coordinate Metrology Systems Conference (CMSC) held last month in San Diego. In addition demonstrating the Omnitrac 2’s Absolute…
NVision Saves Clients Time and Money with Consulting-First Approach
(August 2013) - NVision, the leader in non-contact optical scanning, announced that its technology consulting philosophy has been successful in saving time and money for companies in need of 3D scanning. "Unfortunately, most companies just want to focus on selling their scanning equipment or their…
Coordinate Metrology Systems Conference (CMSC) 2013 Brims with 3D Measurement Innovations and Information
(CMSC: Benbrook, TX ) -- The Coordinate Metrology Society announced today its 29th annual Coordinate Metrology Systems Conference (CMSC) attracted more than 500 professionals worldwide in the 3D portable measurement and inspection field. CMSC 2013 was held July 22-26, 2013 at the Sheraton San Diego…
Meggitt Sensing to Exhibit Endevco Sensors at NI Week Conference
(Meggitt Sensing: Irvine, CA) -- Meggitt Sensing Systems, a Meggitt company and leader in sensing and monitoring systems for extreme environments, will be highlighting its Endevco line of sensors at the upcoming NIWeek conference Aug. 5–8, 2013, at the Austin, Texas, Convention Center. The Meggitt…
Distance Measurement Sensors From SICK Offer Increased Mounting Flexibility
(SICK: Minneapolis) -- SICK, one of the world’s leading manufacturers of sensors, safety systems, machine vision, encoders, and automatic identification products for factory and logistics automation, has launched the Dx35 line of laser distance measurement sensors. These mid-range distance…
Address Counterfeit Drug ID in the Field
(Spectral Evolution: Lawrence, MA) -- The worldwide counterfeit drug market continues to expand, both in developing and developed countries. From fake antimalarial drugs in Africa to counterfeits sold over the Internet, these drugs are detrimental in three primary ways: • Patients don’t receive the…
Brunson to Exhibit Portable Metrology Products at the 2013 CMSC
(Brunson: Kansas City, MO) -- Brunson Instrument Co., manufacturer and provider of 3D measurement and alignment solutions, will exhibit their portable metrology accessories at the 29th annual Coordinate Metrology Systems Conference (CMSC), which runs July 22–25, 2013, in San Diego. This conference…
CMSC 2013 Will Include 3D Metrology Career Fair, USS Midway Museum Tour
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) announced its final schedule of events for the 29th annual Coordinate Metrology Systems Conference (CMSC) from July 22–26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego. The conference is known for its superior slate of…
Quantum Dot Technique Combines Optical and Electron Microscopy
Researchers working at the National Institute of Standards and Technology (NIST) have developed a new microscopy technique that uses a process similar to how an old tube television produces a picture—called cathodoluminescence—to image nanoscale features. Combining the best features of optical and…
Microscopy Technique Could Help Develop 3D Computer Components
A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to monitoring the next generation of computer-chip circuit components, potentially providing the semiconductor industry with a crucial tool…
V-CAD Rapid Produces Measurements in Seconds
(Schneider Messtechnik, Bad Kreuznach, Germany) -- Schneider Messtechnik, a leading company in the field of production measurement technology, has launched V-CAD rapid, a 2D optical measuring device that is both mobile and compact. “Thanks to the intuition-based user interface of the M3 measuring…
Paul N. Gardner Releases Three Paint and Coating Testing Applicators
(Paul N. Gardner: Pompano Beach, FL) -- Paul N. Gardner Co. recently released three products for testing paints and coatings: an anti-sag meter, multiple clearance square applicator, and a stainless-steel bar film applicators. Anti-sag meter Coatings applied on nonhorizontal surfaces will sag due…
DCS to Roll Out New Integration for High-End Visualization
(Dimensional Control Systems: Troy, MI) -- Dimensional Control Systems (DCS), developer of variation analysis and quality management system software and provider of engineering services, is presenting at RTT Excite 2013 June 20–21, 2013, at RTT’s (developer of unique solutions for product…
Hexagon Metrology Launches Optiv Classic 443 tp
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has announced the release of the Optiv Classic 443 tp coordinate measuring machine (CMM), the newest model in the Optiv Classic series. The unit comes touch-trigger probe ready and includes a high-resolution color CCD camera for…
Full House at 29th Annual CMSC
(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has filled all 27 speaker slots at the 2013 Coordinate Metrology Systems Conference (CMSC) scheduled for July 22–26, 2013, at the Sheraton San Diego Hotel and Marina in San Diego, California. Each year, the event attracts hundreds of 3D…
ATOS Core Series: Ultra-Compact Powerhouse
(Costa Mesa, CA) -- The ATOS Core series is the newest addition to the ATOS product line of advanced 3D scanners engineered by optical metrology systems expert GOM in Braunschweig, Germany. The ATOS Core is truly a mini-powerhouse. It fuses the latest 3D scanning technology and intelligent…
Hexagon Metrology Launches PC-DMIS 2013 at HxGN LIVE
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has announced the launch of PC-DMIS 2013, a significant development release of the world’s most popular metrology software. PC-DMIS focuses on the collection, evaluation, management, and presentation of manufacturing data to reduce…
Hexagon Metrology Announces PC-DMIS Touch
(Hexagon Metrology: North Kingstown, RI) -- Hexagon Metrology has introduced PC-DMIS Touch, a revolutionary measurement software for portable arm and DCC CMMs. Utilizing high-resolution multi-touch display technology, users physically interact with measurement sequences, feature variables, and…
Don’t Miss the NACMA @ NIST Workshop and Conference
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting and co-organizing the 2013 North American Coordinate Metrology Association (NACMA) meeting, Aug. 27–30, 2013, at NIST in Gaithersburg, Maryland. The NACMA @ NIST conference is focused on training for…
Don’t Miss the NACMA @ NIST Workshop and Conference
(NIST: Gaithersburg, MD) -- The National Institute of Standards and Technology (NIST) is hosting and co-organizing the 2013 North American Coordinate Metrology Association (NACMA) meeting, Aug. 27–30, 2013, at NIST in Gaithersburg, Maryland. The NACMA @ NIST conference is focused on training for…

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