Six Sigma Excellence Award Winners Announced
Tue, 03/14/2006 - 22:00
The winners of the prestigious Six Sigma Excellence Awards were announced recently at the seventh annual Six Sigma Summit in Miami. Rudy Giuliani, former mayor of New York, was the conference’s keynote speaker, and conference organizer IQPC… NCQA Stiffens Its Requirements
Mon, 03/13/2006 - 22:00
The National Committee for Quality Assurance has released a draft standard of its 2007 accreditation requirements for public comment. The draft includes increased requirements for managed care organizations and preferred-provider… Fuji and Cogiscan Announce Their Collaboration
Mon, 03/13/2006 - 22:00
In a strategic partnership, Fuji Machine Manufacturing Co. and Cogiscan will develop and market a new RFID technology for Fuji machines. The companies jointly developed the RFID Smart Reader kit for Fuji’s XP-series machines. The kit will… Shingo Prize Winners Announced
Mon, 03/13/2006 - 22:00
Ten very different organizations recently received The Shingo Prize for Excellence in Manufacturing.The prize, which has been dubbed the Nobel Prize of manufacturing, recognizes organizations’ quality and efficiency achievements…
Leica Geosystems to Showcase CMM at WESTEC
Mon, 03/13/2006 - 22:00
Leica Geosystems’ Metrology Division will showcase its Universal CMM product line at the upcoming WESTEC show in Los Angeles. The Universal CMM consists of a Leica Laser Tracker combined with the Leica T-Scan and/or the Leica T-Probe II.… Microsoft Unveils New Lean Application
Mon, 03/13/2006 - 22:00
Microsoft Corp. has partnered with USC Consulting Group LLC to roll out its new lean technology for manufacturing companies. Microsoft has redesigned its approach to key clients by developing a “trusted advisor” role in which it helps clients… Wal-Mart Suppliers Get a Deal on RFID Equipment
Mon, 03/13/2006 - 22:00
Wal-Mart recently decreed to almost 70,000 of its suppliers that they must start using RFID chips—a nightmare for smaller companies that might not be able to afford to implement such a system. Fortunately, an RFID provider has agreed to… Instron Offers Temperature Calibration Services
Mon, 03/13/2006 - 22:00
Editor’s Note: An incorrect version of this story was included in the Feb. 21 issue of “Quality Insider.” The following is the correct version. We apologize for any confusion this mistake may have caused. Instron Corp. now offers on-site… YESTech Receives Service Excellence Award
Wed, 03/08/2006 - 22:00
YESTech Inc., a supplier of automation-inspection and yield-enhancement systems for the electronics industry, recently received the Service Excellence Award from Circuits Assembly magazine. The award recognizes companies that receive the highest… Metrology Interoperability Summit Approaches
Wed, 03/08/2006 - 22:00
Hundreds of metrology professionals are expected to attend the International Metrology Interoperability Summit, March 28–30 in Gaithersburg, Maryland. The goal of the event is to define a unified “technology roadmap” for dimensional…