The O-INSPECT line of CMMs from Carl Zeiss is growing
Features SmartLock technology
Noncontact, precise solution from Nextec
A team at Germany’s Fraunhofer Institute has develped a scanner that can track passing trains
Intense competition among end users creates substantial market for metrology equipment
Image of the day for May 15, 2012
Image of the day for May 14, 2012
Wed., May 16, 2012, in Schaumburg, IL
Lighter weight and ergonomic handle
Absolute accuracy for internal geometry
May 22–23, 2012 in Detroit
The S8000 Remote is accurate enough to verify calibration of other devices
Creaform webinar, May 15, 2012, at 9 a.m. EDT
New sensors can identify gasses containing up to 20 different chemicals
Purchase of R&R Sales supports Renishaw’s focus on metrology systems
The 3.2 billion-pixel instrument will capture the widest and deepest view of the night sky ever
3-D measurement and inspection professionals share knowledge of technology solutions
New facility in Birmingham, Alabama, offers metrology information, product demos
Inspect large, complex parts without moving the coordinate measuring machine
June 14–22, 2012, in Colorado Springs, CO