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Nikon JCM-6000 NeoScope II
Higher magnification, touchscreen control, sleek design
MarSurf XR 1, Economical, Mobile, PC‑Based Surface Measuring System
Affordable entry into higher-end surface metrology systems
New Probe from Carl Zeiss Increases Productivity
Accurate and flexible measurements with VAST XTR gold
Ultra-High Vacuum True-Absolute Optical Encoder
Renishaw’s new encoder is suitable for both linear and rotary applications
Fluke Introduces 320 Series Clamp Meters
Long-lasting clamps deliver reliable results for high-demand electrical applications
Kistler Accelerometers for Flight Tests
For in-flight structural analysis, simulator qualification testing, and aircraft bay and equipment monitoring
Two New Jofra Temperature Calibrators
For calibrating sensors used in health care, medical, pharmaceutical, biotechnology and food processing
RFID Controller and IO-Link Master in One Device
For material flow control in production systems
FARO Vantage Delivers Elite Performance in a Compact Package
Honeywell Introduces NBP Series Basic Board Mount Pressure Sensors
High quality and high resolution in a cost-effective solution
From Inspiration to Ground Zero Monument
NVision scanner plays key role in creating 13-ft bronze sculpture
Video Conference Demos of Optima vT Leak and Flow Tester
Uson offers application-specific solutions for improving yields and quality
Barcode and Machine Vision Products for Automated Lab Processing
Microscan demonstrates latest products at Clinical Lab Expo 2012
Hexagon Debuts PC-DMIS 2012
Fast Go/No Go Judgments with Electronic Dial Bore Gauges
Sunnen introduces easy to read and use electronic bore gauges at IMTS
FARO Announces Release of the Prime
Six-axis, Bluetooth-equipped portable measurement arm for contact-only inspection
Check Out CC-16L Benchtop Optical Comparator at IMTS 2012
Featuring generous measuring range, two LED light sources, and two digital readout units
Olympus Launches IX3 Microscope Series
Three inverted research microscopes offer flexibility and precision
Benchmark 250-S to Be Showcased at IMTS 2012
For in-process micro-measurements
Newest Version of SmartProfile GD&T Evaluation Software at IMTS 2012
Fast, accurate analysis of measured data compared to a part’s CAD model

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