Oct. 21–22, 2014, in Detroit
Updated content, improved navigation to make key information more accessible
Handheld device allows fast, accurate data capture and transfer to mobile devices
Single-point probing and feature scanning allow fastest data capture for each part
High-school students learn real-world skills on a Zeiss coordinated measuring machine
All new modules and features for automated inspection, guided assembly, and reverse engineering
New interface can actually guide user through typical operations
Authority on quality management and charter member of Education Division of ASQ
New technique saves time and money
30th anniversary celebration attracts metrologists from around the globe
Exhibit runs Sept. 8–26, 2014
Server-based virtual microscopy data organization ideal for pathology research
Stop by booth E-5200 in the quality assurance pavilion