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Product News: Delcam’s PowerMILL Reduces Machining Times for Kobe
Also reduces amount of hand finishing required.
Product News: Hexagon Metrology Releases PC-DMIS 2010
Measuring software capabilities enhanced with new features
Product News: Versatile i-LAB Hand-Held Spectrometers
Cole Parmer’s new spectrometers are flexible and lightweight for taking readings remotely and anywhere.
NIST Detector Counts Photons With 99% Efficiency
Measures nearly the same detection efficiency for every device
Product News: New Cognex Image Engines Combine Code Reading and Vision Tools
Programmable vision devices for original equipment manufacturers
Company News: Thermo Fisher Opens Global Food Safety Response Center
Designed to aid governments and businesses facing unknown food safety threats involving chemical contaminants
Company News: New TIP Competition Focuses on Manufacturing Research
Technology Innovation Program offers cost-shared funding for research
Product News: MVS for Improved Performance Verification of Automated Liquid Handlers
Artel's Multichannel Verification System now provides traceable measurements of 384-well dispenses
Knowing When Poultry Goes Foul
New method of sampling the air above the food
AICON’s TubeInspect Is Fit for Free-Forming
It now carries out automatic correction on Wafios free-form bending machines.
Product News: LaserLinc Develops Customizable Reports From Microsoft Excel
Users can set up report templates in Microsoft Excel, specifying desired layout features.
Product News: Rapidform XOR3 Software Is Compatible with Five CAD Applications
Rapidform XOR does real reverse engineering, not just surface extraction.
Product News: Narda SRM-3006 Selective Radiation Meter
For RF safety, engineering, and standard safety applications
Product News: Tecan US Bolsters Service Program With Artel MVS
Rapid performance verification of automated liquid handlers in life sciences
Product News: Olympus Introduces New Long Scopes for Industrial Videoscopes
IPLEX LX and IPLEX LT are ideally suited for visual testing of deep or difficult-to-reach areas.
Reminder: CMSC 2010 Call for Papers
Abstracts requested by April 16.
Event: DMIS 5.2/I++DME Training Workshop Approaching
April 19–22 in Brighton, Michigan
Company News: Emerson Supports Process Manufacturing’s First Global Wireless Standard
Unanimous certification a major industry milestone; wireless control benefits plant operations and lowers costs
Product News: New Seal-Sensor Ultrasound Inspection System
PTI’s new sensor used for nondestructive pouch seal testing
Image Analysis System Based on Terahertz Wave Technology
Able to perform structural, chemical, and quantitative distribution scans

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