{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

        
User account menu
Main navigation
  • Topics
    • Customer Care
    • Regulated Industries
    • Research & Tech
    • Quality Improvement Tools
    • People Management
    • Metrology
    • Manufacturing
    • Roadshow
    • QMS & Standards
    • Statistical Methods
    • Resource Management
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • Customer Care
    • Regulated Industries
    • Research & Tech
    • Quality Improvement Tools
    • People Management
    • Metrology
    • Manufacturing
    • Roadshow
    • QMS & Standards
    • Statistical Methods
    • Supply Chain
    • Resource Management
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Training

Product News: OIM 6.0 Electron Backscatter Diffraction Software

EDAX Inc.'s release is written for 64-bit processor and is compatible with Microsoft Windows 7.

EDAX Inc.
Bio
Fri, 06/11/2010 - 11:56
  • Comment
  • RSS

Social Sharing block

  • Print
Body

(EDAX Inc.: Mahwah, NJ) -- EDAX Inc., part of AMETEK Inc.’s Material Analysis Division, a provider of X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM 6.0. The software is the first microanalysis package written for 64-bit processor and Microsoft Windows 7-compatibility, and its datasets include more than 40 million data points.

ADVERTISEMENT

OIM software offers easier access to the most commonly used functions along with one-button analysis. Among the latest features incorporated into OIM 6.0 are expanded QuickGen and template functionality, full-image area mapping, easier data rotations, interactive page colors, and password-protected, system-level settings. OIM 6.0 also offers improved user access with advanced visualization tools, an interactive status bar, and data processing log to automatically record post processing performed on datasets.

 …

Want to continue?
Log in or create a FREE account.
Enter your username or email address
Enter the password that accompanies your username.
By logging in you agree to receive communication from Quality Digest. Privacy Policy.
Create a FREE account
Forgot My Password
You Might Like...
Rhopoint PANTORA Aesthetix Streamlines Creation of Digital Material Twins
E-Z LOK Offers Coil Insert Assortment Kits
Implementing Manufacturing Training Programs in 2026
Otis Expands Little Engineers STEM Program Globally
CAISI Issues Request for Information About Securing AI Agent Systems

Add new comment

Image CAPTCHA
Enter the characters shown in the image.
Please login to comment.

© 2026 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us