Experimental Uncertainty Analysis for NDT on the CSX Wilbur Bridge
A 154-page report by Moreu and LaFave in 2012 explains unique problems railroad bridge engineers must contend with.
Worth a Read: The Technology Roadmap for Large-Scale Manufacturing
Achieving Smart Factory initiatives requires a seismic shift toward data-driven processes, sensors, and advanced metrology solutions. Large-scale manufacturers bear the load of crushing backlogs and internal pressures to eke out more productivity.
Hats Off to the Brawn Behind the CMS Certification Program
Shepherding the implementation of any new program takes strong leadership. Building a strong, legally defensible certification program calls for a herculean kind of dedication. Randy Gruver was just the guy for the job.
Happy Birthday, CMSC!
A 35-year commitment is an impressive achievement, whether it be to a job, a marriage, or even a sports franchise.
A Metrology Constant
A clear constant in the portable metrology market is “change and integration.” Almost every new product launch couples existing concepts and wraps them with tools that enable integration into hybrid metrology-guided systems.
What to Do When Measurement Methods Produce Different Answers
What are you looking to measure? This is one of the central questions for a metrologist (a measurement scientist) and is usually answered before measurements can proceed.
Fixed vs. Portable Coordinate Measuring Machines
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If your manufacturing organization is going to grow, you know you need an inspection solution beyond the capabilities of micrometers and calipers. You know you need to gather more data in a faster and more reliable manner.
The Case for Building Beautiful Instruments
I discovered my affinity for attractive instruments while working a job before coming to NIST. My boss at the time had a love affair with the common hose clamp—the one with the worm gear.
Women in Technology
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Traditionally, technical jobs have been underrepresented by women. But that's changing, says Emily O'Dea, commercial services process manager at Hexagon Manufacturing Intelligence.
New X-ray Measurement Approach Could Improve CT Scanners
A new measurement approach proposed by scientists at the National Institute of Standards and Technology (NIST) could lead to a better way to calibrate computed tomography (CT) scanners, potentially streamlining patient treatment by improving communication among docto