(PANalytical: Almelo, the Netherlands) -- PANalytical has extended the compatibility of its Omnian advanced standardless analysis software to now include the compact benchtop MiniPal 4 X-ray fluorescence (XRF) spectrometer.
(Cognex: Natick, MA) -- Cognex Corp. has announced a new option to deliver its VisionView operator interface to any VGA display.
(SME: Dearborn, MI) -- A long-time advocate of lean practices, the Society of Manufacturing Engineers (SME) member and author, Mark Hamel, has been awarded The Shingo Prize Research and Professional Publications Award for the
n 2006, the Massachusetts Institute of Technology (MIT) kicked off a project called the Vehicle Design Summit (VDS), which today has grown into a large international consortium of teams from universities and innovative companies seeking, a
Hiram Powers (1805–1873) is considered one the America’s great neoclassical sculptors. His works were popular in his time and remain so today.
(Eriez Manufacturing Co.: Erie, PA) -- Eriez’ E-Z Tec X-ray Inspection Systems deliver the highest level of product and packaging integrity for pharmaceutical applications.
(Leica Geosystems: Norcross, GA) -- Following the successful Q4 2009 release of its Leica ScanStation C10 laser scanner, Leica Geosystems announces new system enhancements tha
(FARO Technologies Inc.: Lake Mary, FL) -- FARO Technologies Inc., the world’s leading provider of portable measurement and imaging solutions, has announced the release of FARO Scene 4.7, the latest version of its scan processing software for the FARO laser scanner.
(Nikon Metrology Inc.: Brighton, MI) -- Nikon has formed Nikon Metrology Inc., a new company that combines Nikon Instruments Inc.’s industrial instruments business with the former Metris business, acquired by Nikon Corp. in 2009.