(National Instruments: Austin, TX) -- National Instruments (NI) recently announced four new R Series multifunction reconfigurable input/output (RIO) boa

(Veriteq: Vancouver, BC, Canada) -- Veriteq Instruments recently announced the release of their new viewLinc monitoring and alarming system for regulated controlled environments.

(Marposs Corp.: Auburn Hills, MI) -- Marposs Corp. will introduce the i-Wave, its newest wireless device in the M1 Star bore gauge product line, at Quality Expo 2009 in booth 4739, Sept. 22–24, in Rosemont, Illinois.

(ASD: Birmingham, MI) -- ASD’s GageMux USB simplifies and streamlines data collection.  Specifically developed to keep on the cutting edge of technology, the new GageMux USB multiple input gauge interface now has three user selectable outputs of backward compatibility and environmentally friendl

(Promess Inc.: Brighton, MI) -- Promess Inc. has added a series of hollow-shaft units to its line of Torque Functional Test (TFT) Systems intended for intelligent assembly applications.

(Quality Digest: Louisville, KY) -- As first reported in the July 17th issue of Quality Digest Daily, Hexagon Metrology has filed patent infringement litigation against Metris N.V.

(Hexagon Metrology Inc.: North Kingstown, RI) -- Hexagon Metrology Inc., on July 21 at the Coordinate Metrology Systems Conference (CMSC) in Louisville, Kentucky, announced the North American debut of the new Leica TDRA6000 Total Station, the most accurate Leica Geosystems total station ever rel

(Lattice Technology Inc.: San Francisco) -- Lattice Technology, developers of digital manufacturing applications using the extensible virtual world description language (XVL) format, today announced Version 6.0 of its XVL Converter applications, delivering the tools to convert 3-D CAD data into

(Quality Digest: Louisville, KY) -- Real-time 3-D capture and comparison to a CAD model—on a moving part—generated some excitement at the CMSC show when Creaform demonstrated the capabilities of its HandyPROBE 3-D probing system running with

(Aven Inc.: Ann Arbor, MI)—Digital microscope users gain all-in-one convenience from the first integrated systems that combine image capture, measurement, annotation, and networking capability without external software or hardware.