Metric Week Begins 10/10/10Embrace metrics. And our old system? Forget about it!
Fri, 10/01/2010 - 12:51
(NIST: Gaithersburg, MD) -- Every day is a metric day at the National Institute of Standards and Technology (NIST). But that won’t stop the agency from celebrating Metric Week, held annually the week of Oct. 10—the tenth day of the tenth month.… NIST Experiment Proves Your Head Is Older Than Your FeetNIST time-dilation experiments test Einstein’s theories of relativity
Thu, 09/30/2010 - 06:00
(NIST: Gaithersburg, MD) -- Scientists have long known that time passes faster at higher elevations—a curious aspect of Einstein’s theories of relativity that previously has been measured by comparing clocks on the Earth’s surface and a high-flying… Product News: NX CMM Inspection Programming First To Be DMSC-CertifiedThe goal of an information exchange standard is interoperability
Tue, 09/21/2010 - 13:41
(NIST: Gaithersburg, MD) -- Siemens PLM Software’s new NX CMM Inspection Programming application, the latest addition to the NX software part-manufacturing solutions, has become the first inspection programming software application officially… 16 Organizations Chosen to Receive Site Visits for 2010 Baldrige Award Award recipients are expected to be announced in late November
Wed, 09/15/2010 - 12:17
(NIST: Gaithersburg, MD) -- The panel of judges for the Malcolm Baldrige National Quality Award, the nation’s highest recognition for organizational performance excellence, has selected 16 organizations for the final review stage for the 2010 award… The Perfect Nanocube: Precise Control of Size, Shape, and CompositionPerfect cubes down to 3.4 nanometers
Mon, 09/13/2010 - 06:00
With growing interest in using nanoparticles for everything from antibacterial socks to medical imaging to electronic devices, the need to understand the environmental, health, and safety risks of these particles also grows. Researchers at the… Micro Rheometer is Latest Lab-on-a-ChipDevice can take much smaller sample measurements of complex fluids
Wed, 09/08/2010 - 06:00
(NIST: Gaithersburg, MD) -- Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a microminiaturized device that can perform complex viscosity measurements—critical data for a wide variety of… Extreme Darkness: Carbon Nanotube Forest Covers NIST’s Ultra-Dark DetectorLaser power detector reflects almost no light across the visible part of the infrared spectrum
Thu, 08/19/2010 - 06:00
(NIST: Gaithersburg, MD) -- NIST will use the new ultra-dark detector, described in a new paper in Nano Letters, to make precision laser power measurements for advanced technologies such as optical communications, laser-based manufacturing, solar… Product News: NIST Engineers Nanoscale Fluidic DeviceSeparates and sizes nanoparticles
Mon, 08/09/2010 - 06:00
(NIST: Gaithersburg, MD) -- A wrench or a screwdriver of a single size is useful for some jobs, but for a more complicated project, you need a set of tools of different sizes. Following this guiding principle, researchers at the National Institute… Baldrige Fellows Selects 14 Executives for Initial ClassElected fellows help promote performance excellence and study the effect of systems thinking on organizations
Tue, 08/03/2010 - 16:08
(NIST: Gaithersburg, MD) -- The Baldrige Fellows, an executive development program centered on forming relationships with and learning from Baldrige National Quality Award recipient organizations and their senior executives, recently announced the… Company News: NIST Nanoscale Dimensioning Technique Wins R&D 100 AwardInnovative through-focus scanning optical microscopy has potential to save millions of dollars
Fri, 07/23/2010 - 15:54
Ravikiran Attota, a lead researcher in NIST’s Precision Engineering Division, won an R&D 100 Award for his development of through-focus scanning optical microscopy (TSOM), which has applications that cut across a range…