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Accurate Weighing of Bulk Materials Using XP Microbalance Sieve Analysis
A simple, accurate, and logical technique that reduces errors
Twin ARTEMIS Probes to Study Moon in 3-D
Multiyear research mission will map lunar surface and magnetic field
CMSC 2011 Rounds Out Conference With Exciting Special Events
Ice-breaker networking event, Boeing tour, community service event, and 5 Billion Micron Fun Run/Walk
Convince 2011 3-D Scanning and Quality Control System
3Shape’s improved lineup includes three new scanners and two software packages
Stream Microscope Software Gets Intuitively Easier
New refinements and flexibility carry the workload of industrial labs
Newport Corp. Enters Into Agreement to Acquire Ophir Optronics
Merger will create global photonics industry leader
Nemo Compact Gauge Computer Launched at Quality Expo
Enables quick and simple programming of measurement applications
Perform Profile and Roughness Measurements on Nearly Any Material
VK-X Series 3-D laser scanning microscope combines capabilities of a SEM with the ease of optical microscope
Upgrade Available to SpectraMagic NX
For easy inspection and quality control of color
Eight-Channel, Multi-Input Analog Measurement Module
For mobile measurement applications with stringent reliability and high sample rate requirements
ConfoMap Surface Analysis Software for ZEISS Microscopes
For detailed surface metrology reports in accordance with latest standards
World Record Set for Roundness Measurements of Bearings
A mere 77.77 seconds using the Surtronic R-Series
New CM-3600A/3610A Spectrophotometers
Konica Minolta’s latest offer full data compatibility, simultaneous SCI/SCE measurement
High-End Spectromometer Offers Highest Precision in Metal Analysis
Hybrid optic processes light directly from spark stand with photomultipliers and CCD detectors
Hexagon Metrology Announces Reverse Engineering Webinar
From point clouds to CAD models with PC-DMIS Reshaper
Good Weighing Practice Verification Increases Weighing Accuracy
Mettler-Toledo service ensures final-product consistency through expert assessment and benchmarking
Three Days of 3-D Scanning and Printing
Neometrix workshops hit Birmingham, Atlanta, and Orlando in July
Announcing the PosiTector 6000 Coating Thickness Gauge
Smarter, faster, and more powerful than ever before
FARO Partners with USF on Laser Scanner Training
Employees and managers get before, during, and after training by 3-D imaging experts
NVision Offers Product-Defect Analysis
Noncontact scanning and reverse engineering can determine if and when a defect occurred

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