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Event: NDI Announces Fall Metrology Education Webinar
Learn about part-to-CAD inspection, reverse engineering, and more.
Fluke Introduces New, More Accurate Electrical Power Standards
6100B and 6105A provide precise reference power and energy for instrument calibration.
Product News: Air Assist Movement System Enhances CMM Productivity
Other benefits include safety, ergonomics, accelerated feedback of data to the shop floor.
Product News: New Sensor to Improve Paper and Board Quality With Less Waste
Precision FotoFiber captures fiber angles at high speeds, reducing lab profile analysis
Product News: Olympus Introduces New IPLEX LX, IPLEX LT Industrial Videoscopes
New Beryllium Reference Material for Occupational Safety Monitoring
Material to dramatically improve methods used to monitor workers’ exposure and aid in contamination control.
Product News: Green Laser for High-Throughput Micromachining
Best cost-to-performance ratio for demanding micromaching tasks
Mandatory Reopening of Takeover Bid of Nikon on Metris
Results in 95.04-percent ownership of Metris shares. Following is a squeeze-out and delisting procedure.
Updated NIST Master Plan Sent to Capital Planning Commission
The document lists planned and possible future additions and improvements to the Gaithersburg campus.
Product News: miView Improves Efficiency, Eliminates Waste in Machine Tool Apps
Solution combines GE Fanuc expertise in machining and data collection with GE’s lean Six Sigma culture.
Product News: Leica Zeno GIS
An easy mobile GIS solution
Event: 2010 Ultrasonic Flow Meter User’s Workshop
Singapore event focuses on gas pipeline flow measurement.
Product News: NDI Adds Wireless Controller to OPTOTRAK PROseries CMM
Truly portable, accurate measuring—no “strings” attached
Diamonds Could be Used as Microscale MRI Probes
It may be possible to probe individual drug molecules and living cells.
Product News: ICP Optical Emission Spectrometer Offers Analysis of Toxins in Toys
Application allows routine analysis of toy samples for consumer safety verification
Product News: Leica Geosystems Releases Leica Viva
A new generation measurement system
Product News: Hexagon Metrology Releases New CMM Options
Analog scanning packages on Brown & Sharpe Global Classic CMMS
NIST’s New Nano-Ruler Sets Some Very Small Marks
How many zeros are in nano?
Product News: Olympus Releases New Material Science Microscopy Software
Streamlines image capture, analysis, and data management
Product News: Maintain NIST Traceability With Portable Calibration Black Body
Do-it-yourself infrared verification

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