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Transforming Audits With AI

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For quality heads, compliance officers, auditors, and engineering leaders, audits have been a time-consuming, resource-intensive process, yet necessary to build resilient operations, prevent costly failures, and maintain competitive advantage.

WFL MILLTURN Technology at Plasser & Theurer

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(Plasser & Theurer: Linz, Austria) -- Plasser & Theurer is a global technology leader for track maintenance machines.

Nuvvon Reports Breakthrough in Solid-State Battery Scalability

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(Nuvvon: Parsippany, NJ) --  Nuvvon, a leader in next-generation energy storage, reports a major breakthrough in solid-state battery scalability.

The Ethics of Choice

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In this article I’m exploring the need for ethics in systems thinking using the ideas of Heinz von Foerster and Russell Ackoff. The two come from different traditions within systems thinking.

Why Forcing Women Back to the Office Will Cost Us Millions

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As companies and government agencies push forward with return-to-office (RTO) mandates, they risk exacerbating a workplace problem that many have failed to address adequately: gender discrimination.

Renishaw Introduces Equator-XTM 500 Dual-Method Gauging System

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(Renishaw: West Dundee, IL) -- Renishaw, a world leader in measuring and manufacturing systems, has launched its latest pioneering solution for shop-floor p

Digital Surf Releases Mountains 11 Software

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(Digital Surf: Besançon, France) -- Digital Surf announces the release of Mountains 11.0, the newest version of its software platform used for surface metrology and microscopy image analysis.

One Simple Question That Keeps You From Falling on Your Sword

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I love passionate people—people who throw themselves into their work with every last bit of energy they have. To them, everything about their work is important. It’s serious business, and they drive hard to form the world in an image they’re proud of.

Bold Laser Automation Launches Cost-Effective Precision Measurement Systems

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(Bold Laser Automation: Bedford, NH) -- Bold Laser Automation, a developer of advanced laser processing and metrology systems, has launched two precision measurement systems engineered to deliver fast, accurate, and

NIST Study Aims to Improve Utility of the Scanning Electron Microscope

  • Read more about NIST Study Aims to Improve Utility of the Scanning Electron Microscope
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Using an electron beam to image the tiniest of defects and patterns on microchips, the scanning electron microscope (SEM) has long been a mainstay of the semiconductor industry.

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