(ISSSC and 10 til 2: Cincinnati) -- The International Society for Six Sigma Certification (ISSSC) and 10 til 2—The Part-time Placement Service—have formed an alliance that will help connect area businesses with highly skilled professionals certified in the Six Sigma program.

(SigmaXL: Toronto) -- The provider of user-friendly Excel add-ins for statistical and graphical analysis, announces the release of SigmaXL Version 6.

New features include:

Ultrasonic leak detection has been used for a variety of applications ranging from energy reduction by locating compressed air leaks to quality assurance inspections, such as locating wind noise and water leaks in automobiles.

Automated inspection and gauging systems can help companies to improve overall product quality and grow their business while reducing manufacturing costs, helping them to become more competitive in this difficult business climate.

(ISO: Geneva) -- The first meeting of ISO’s new project committee PC 242, which is to develop an international standard on energy management, was held Sept. 8-10, 2008 in Washington, D.C.

(Palisade: Ithaca, NY) -- When building simulation models with @RISK, consider the following best practices suggested by Palisade's director of training and consulting, Michael Rees, Ph.D.:

The Coordinate Metrology Systems Conference (CMSC) is next week, July 20–24. There is no event in the United States better situated to communicate the value and return on investment of large scale 3-D metrology than the CMSC. This year’s CMSC, its 25th, will be held in Louisville, Kentucky.

“I suffer simultaneously from amnesia and déjà vu. I have the feeling that I keep forgetting the same thing over and over again.”
—Steven Wright (surreal comedian)

(Paul N. Gardner Company Inc.: Pompano Beach, FL) -- The Novo-Gloss I.Q. is the first hand-held instrument to profile how light is reflected from a surface. Traditional glossmeters measure quantitatively and aren't sensitive to effects that reduce appearance quality. The Novo-Gloss I.Q.

(Olympus: Center Valley, Pa.) -- Process engineers, fab managers, professionals in yield enhancement, process development, and failure analysis will benefit from the newly introduced Olympus defect inspection and review system, the company’s fast and accurate semiconductor defect review solution