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Verisurf Introduces Next-Generation Software

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(Verisurf Software: Anaheim, Calif.) -- Verisurf Software, an advanced technology company that revolutionized manufacturing in the 1990s by providing breakthrough inspection, tool building, reverse-engineering, instrument interchangeability, and reporting capabilities from a single interface,

NDI Launches the OPTOTRAK ScanTRAK Bundled Laser Scanning Solution

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(NDI: Waterloo, Canada) --NDI has announced the launch of the OPTOTRAK ScanTRAK advanced hand-held laser scanning system, a bundled solution and shop floor innovation that combines the power of optical measurement with large-volume, point-cloud laser scanning.

Metris LC60D Laser Scanner Revolutionizes Digital Inspection

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(Metris: Leuven, Belgium) -- Metris (Euronext—MTRS) launches LC60D, a next-generation digital 3-D line scanner. Equipped with state-of-the-art digital technology and powerful on-board data processing, the LC60D scanner more than triples today’s common scan rates.

CogniTens to use PolyWorks/Modeler Software from InnovMetric for Automated Polygon Meshing and Reverse-Engineering

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(CogniTens: Wixom, Mich.) -- CogniTens, a Hexagon Metrology company, and InnovMetric Software announced today the signature of a software di

Updating Connecticut’s Technical High School Program

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(CNC Software Inc., Educational Division: Gig Harbor, Washington) -- Connecticut manufacturers and community colleges have requested that graduates of Manufacturing Technology programs within the Connecticut Technical High School System be well versed in computer-aided manufacturing (CAM).

Metrology Equipment Donated To University

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October Conference to Spur Bioscience Innovation

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(NIST: Gaithersburg, Maryland) -- The National Institute of Standards and Technology and the University of Maryland Biotechnology Institute (UMBI) will cosponsor an international conference on “Accelerating Innovation in 21st Century Biosciences: Identifying the Measurement Standards and Technol

‘Electron Trapping’ for Microelectronics Measurements

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(NIST: Gaithersburg, Maryland) -- Using an ultra-fast method of measuring how a transistor switches from the “off” to the “on” state, resear

Materials Microscope for Quality Control Applications

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QD Launches Video-enhanced Web Site

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(Quality Digest: Chico, California) -- Be sure to check out the new, fully redesigned Quality Digest homepage and web site.

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