Metrology News

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Certified for use in Class 1, Zone 0, Zone 1, and Zone 2 locations
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Smart-manufacturing data platform collects, presents, and initiates accurate process and metrology data
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Supports back-end process control
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Quantum nanometrology just got a step closer
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Produces clearer images of samples of any shape in which dense areas mask less dense areas
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For processed, frozen, and preprocessed vegetables, confections, and more
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Three new single-column models with capacities of 0.5 kN, 1 kN, and 2.5 kN
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At Pack Expo Las Vegas, Las Vegas Convention Center, Sept. 11–13, 2023
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Featuring exceptional linearity, low noise, and stability
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Onsemi XGS sensors up to 45 MP
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New models can test wide range of motor sizes on a single system
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Streamlines the ISO certification process
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ORNL team members applied three independent strategies to decrease their project’s computational workload
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Emphasizes the importance of data traceability in leak testing
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ORNL-developed software tools to be demonstrated at Energy Bootcamp, Oct. 16–19, 2023, in Knoxville, TN
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Puts focus on problems associated with manual setup, calibration, and robot maintenance
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How to capture, communicate, and digitally render appearance characteristics for a more efficient workflow
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For natural gas, biogas, and air quality and process control
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Faster and more robust, with black channel support for functional safety