Metrology News

Air-extend/spring-retract moves probe out of the way

Expanded offering includes Smartscope E-series for 3-axis video measurement

Accelerates CAM programming time 80% to make U.S. manufacturers more productive

Enables scanning electron microscopes to perform in situ Raman spectroscopy

Certified for use in Class 1, Zone 0, Zone 1, and Zone 2 locations

Smart-manufacturing data platform collects, presents, and initiates accurate process and metrology data

Supports back-end process control

Quantum nanometrology just got a step closer

Produces clearer images of samples of any shape in which dense areas mask less dense areas

For processed, frozen, and preprocessed vegetables, confections, and more

Three new single-column models with capacities of 0.5 kN, 1 kN, and 2.5 kN

At Pack Expo Las Vegas, Las Vegas Convention Center, Sept. 11–13, 2023

Featuring exceptional linearity, low noise, and stability

Onsemi XGS sensors up to 45 MP

New models can test wide range of motor sizes on a single system

Streamlines the ISO certification process

ORNL team members applied three independent strategies to decrease their project’s computational workload

Emphasizes the importance of data traceability in leak testing

ORNL-developed software tools to be demonstrated at Energy Bootcamp, Oct. 16–19, 2023, in Knoxville, TN

Puts focus on problems associated with manual setup, calibration, and robot maintenance

Quality Digest