Blue Mountain Quality Resources Expands Training Schedule
Wed, 03/09/2005 - 22:00
Blue Mountain Quality Resources Inc. recently added several new metrology-related training seminars to its schedule.Physical Metrology will be held April 28–29 in Northbrook, Illinois. It will provide a fundamental understanding of physical… NIST Releases Atom-Based Standards for Measuring Tiny Chip Features
Wed, 03/09/2005 - 22:00
Device features on computer chips as small as 40 nm can now be measured reliably thanks to a new test structure developed by the National Institute of Standards and Technology. The new test structures are the product of NIST’s more than four-year… ANSI President to Retire at Year’s End
Tue, 03/08/2005 - 22:00
Mark W. Hurwitz, president and chief executive officer of the American National Standards Institute, will retire from the organization at the end of the year. Hurwitz, 64, was appointed to the post in 1999. He cited his desire to spend more time… NIST and ANSI to Host Forum on U.S. Standards Strategy
Tue, 03/08/2005 - 22:00
The National Institute of Standards and Technology and the American National Standards Institute will co-sponsor a public forum on U.S. standards next month.The event is designed to engage stakeholders in a dialogue about the United States Standards… New Standard Limits Mobile Phone Radio Wave Exposure
Tue, 03/08/2005 - 22:00
The International Electrotechnical Committee recently published a standard that limits the radio waves emitted by mobile phones. Limits on specific absorption rate (SAR)—the rate at which radio frequency energy is absorbed by the human body—are set… New Product for IEEE 1641 Signal Definition Standard
Tue, 03/08/2005 - 22:00
Racal Instruments Inc. recently released newWave, a software toolset designed to facilitate compliance to the new signal definition standard, IEEE 1641. Developed to assist software and test developers use and implement the new standard, newWave… NIST Releases Atom-Based Standards for Measuring Tiny Chip Features
Tue, 03/08/2005 - 22:00
Device features on computer chips as small as 40 nm can now be reliably measured, thanks to a new test structure developed by the National Institute of Standards and Technology. The new test structures are the product of NIST’s more than four-year… National Manufacturing Week Opens in Chicago
Mon, 03/07/2005 - 22:00
The largest North American trade show dedicated to innovation in manufacturing opens this week in Chicago. National Manufacturing Week features a Manufacturing Town Hall panel discussion with top government and trade officials, the National… Omnex Releases New Quality Management Software
Mon, 03/07/2005 - 22:00
Omnex Systems LLC recently released EwQMS 2.0, a software suite aimed at allowing quality managers to quickly build, approve, manage and analyze critical quality documents for continual improvement. By using a centralized repository and… NCQA Announces Physician Certification Option
Mon, 03/07/2005 - 22:00
The National Committee for Quality Assurance and the American Board of Internal Medicine will offer a new program to physicians seeking to maintain their ABIM certification and the opportunity to more easily earn a new distinction: recognition from…
