Less expensive than traditional noncontact digitizers but offers comparable accuracy
Provides measurement of surface-finish parameters according to ISO, ASME, and JIS
The standard for CMM programming
The 20/20 XL can measure micron-sized features
Designed to work under real-world conditions
Advanced features combined with simplified operation expand osmometer’s versatility
Registration deadline for poster presenters is June 23, 2011
June 21–23, 2011, in Colorado Springs
Provide NIST-traceable calibration uncertainties of less than 3 percent
Handheld probe avoids need for a mechanical arm
Four-Port Gage Multiplexer and SmartCable for Data Measurement
MoveInspect CMM allows greater leeway for users
Monitor a separator’s performance over time
An alternative to portable arms and stationary CMMs that require electrical connections
Artel sponsors ‘Pipetting Olympics’ competition for U.S. labs
ABTech’s μicroForm measures runout, roundness, flatness, parallelism, squareness, and concentricity
Offers worldwide certification services from one location
A cost-effective alternative to custom-made manifolds typically required by testing labs
Designed to compensate for changes in process temperature and pressure
CMSC will be held in Phoenix, July 25–29, 2011