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Hexagon Webinar on PC-DMIS 2011 MR1
Free event Thurs., Oct. 27, 2011, from 11:30–12 p.m.
National Instruments to Host Measurement and Control Technical Symposiums
Held in 24 cities throughout North America from October to December
Spectro Launches Next-Generation Spectro xSORT
Handheld EDXRF spectrometer offers speed, accuracy, ease of use
Olympus Supports Surface Metrology Conference at WPI
Oct. 24–25, 2011, in Worcester, Massachusetts
CRYSTA-Apex S CMM Offers Enhanced Performance
Doubles effective measuring range at a given tolerance, compared to typical CMMs
Fully Automated Part-to-CAD Measurement Verification
A breakthrough in noncontact comparative measuring technology
MICURA: A New Coordinate Measuring Machine from Carl Zeiss
High precision, compact, bridge-type CMM features offers 0.9 micron + L/400 accuracy
Scorpion Vision for 3-D Robot Vision Integration
An open software tool for industrial vision
Cameras Deliver Higher, Faster, Better
Falcon2 series delivers fast frame rates, true global shutter operation
NERLITE Smart Series Machine Vision Lighting for Industrial Applications
The better the lighting, the better to see the part or mark
FARO Launches Campaign to Help Breast Cancer Research
Comment on FARO’s message board beginning Oct. 20, 2011, and the company will donate $5
Precision Noncontact Laser Measurement on Metal, Wood, Ceramic, Painted Targets
Self-contained laser displacement using 1,024 pixel CMOS linear imager
USB3 Vision Camera Interface Standard Announced
Standard’s focus is on device discovery, device control, event handling, and streaming data
Small, Flexible Candlestick Sensor Measures Temperature and Air Velocity
For characterizing thermal conditions in electronic systems
MEMS Capacitive Accelerometers for Automotive, Aerospace, and Civil Engineering
Designed to support single-axis and triaxial measurement requirements
Olympus Launches Free Industrial Tech Guide App for iPhone, iPad
For technicians performing ultrasonic flaw detection and X-ray fluorescence inspections
Handheld Accelerometer Signal Output Simulator and Tachometer
Portable verification for instrumentation settings and cable integrity
Newport Introduces Standard Vacuum Stages
For use in critical sample positioning or beam management processes in vacuum environments
Webinar: Reduce 3-D Modeling Time by Changing Your Scan-to-Model Workflow
Oct. 19, 2011, at 2 p.m. EDT
Increased Productivity, Versatility for ScanStation Laser Scanners
Onboard control for field quality assurance

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