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New ISO/IEC Guide to Metrology Vocabulary

EOS International User Meeting

ISO/IEC Guide Metrology Published

A New Approach to Surface Profiling

Guide to Friction, Wear, Erosion Testing

Development Program for Sub-32nm Metrology

Bringing the World’s Highest-Resolution Nanoprober to Asia

Faster, Easier Access to Imagery and Maps

Ray Ryan Joins Brunson

2008 CMSC Call for Papers

Exact Metrology Acquires Berding 3D Scanning

Creaform Introduces EXAscan

Hexagon Acquires CogniTens

ROMER Releases INFINITE 5012 Measuring Arm

Radiation May Help Knock Out Malaria

RFID-Based Reel Detection

Automated XRF Online Test for Fast Alloy Quality Control

Improved Quality in the New Leica TPS1200+ Total Station

Fourth Annual Ultrasound World Conference

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