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Mergers and Acquisitions in the World of Metrology
The Secret for Sustaining 5S
It’s not what you do, but where you start
Selecting Next-Generation Laser-Scanning Technology
Retrofitting CMMs with one of the newer laser arms can serve both cost and part quality
Benefits of Silicon-Based Temperature Sensors
Extremely stable crystal silicon makes sensors literally rock solid
Attracting the Next Generation of Research Scientists
Paid internship steers minority students into science careers
When to Use LVDTs vs. Optical Scanning
Both are used for the same purpose, but they operate in quite different ways
NIST and Forest Service Create Hazard Scale for Wildland Fires
Exposure ratings can map a community’s varying risks from embers and fire
3D Optical Metrology: Dynamic Referencing Brings Higher Accuracy
Mitigating measurement errors caused by vibration
CA Cycleworks: From Art to Ducati
Motorcycle enthusiast and product developer turns ideas into reality
Laser Scanning the Cliffs of Moher
Vessel-mounted mobile LiDAR captures this potential UNESCO site
NPL Freeform Standards Support Measuring Unconventional Shapes
These complex reference artifacts provide traceability routes for freeform surfaces
Extreme Sports Meet 3D Scanning
Scanning and aerodynamical optimization help street lugers take on world speed record
Portable Digital Microscopes Improve Fire Safety
The latest engineering tool for improved fire safety
Roll and Web Alignment With a Laser Microgage
Lasers can accurately verify position and alignment of rolls and web-handling equipment
CMS Certification Program Takes a Giant Step
Laser-Based 3D Metrology in Fusion Plasma Physics
High-Resolution 3D Capture of High-Speed Objects
Introducing the White-Light Hybrid Positioning 3D Scanner
Creaform’s handheld scanner uses geometric- and target-based positioning
Streamline Calibration Documentation and Maintenance
Beamex and Emerson software partnership offers paperless, integrated solution
Connector Pin Inspection With 3D Profilometry
Chromatic confocal technology offers precise measurements even for microelectronics

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