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Zeiss Marks Scanning-Electron Microscope’s 40th Anniversary

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Carl Zeiss SMT recently marked the 40th anniversary of its watershed scanning electron microscope.The product was developed in 1965 by Cambridge Inst

COMET Opens New North American Service Center

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COMET North America Inc. recently hosted the grand opening of its service and repair center at its headquarters in Stamford, Connecticut.

Geodetic Systems Introduces New Digital Photogrammetry System

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Geodetic Systems Inc. recently launched V-STARS/E4X, an entry-level digital photogrammetry system with a wide range of applications.

Mitutoyo Names Crotts & Saunders as Exclusive Distributor

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Mitutoyo America Corp.

Metrology Conference Measures Record Attendance

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The 2005 Coordinate Metrology Systems Conference logged record attendance figures and earned raves from attendees about the show’s 3-D metrology

Not Required to Calibrate Your Test Equipment?

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What is calibration anyway?

Z10 OHS Integration Standard Approved by ANSI

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The American National Standards Institute recently granted final approval to a new standard, ANSI/AIHA Standard Z10.The new standard allows o

TÜV America Accredited to Perform Canadian Field Service Inspections

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The Standards Council of Canada recently expanded TÜV America Inc.’s accreditation to include SPE-1000-99, field evaluations and special inspectio

SCC To Celebrate Anniversary

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The Standards Council of Canada will simultaneously commemorate its 35th anniversary and World Standards Day next month.

Standards Workshop to Focus on Security Industry

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An upcoming American National Standards Institute course will examine the use of an emerging standardization process in the homeland securi

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