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Micron Technology Joins International SEMATECH Manufacturing Initiative

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(Austin, Texas) -- One of the world’s leading providers of advanced memory and image sensor solutions, Micron Technology Inc., has joined the Intern

International Metrology Congress Announced

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(College Français de Metrologie, Lille, France) -- The 13th annual International Metrology Congress will be held June 18–29 in Lille, France.

CMSC Calls for Papers

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(Reno, Nevada) -- Think you have an interesting metrology project or issue that would make a good presentation?

NIST Report on U.S. Innovation Tags Measurement Challenges

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A Conversation

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In a previous column, we discussed the importance of the IECQ quality assessment systems for electronic components, a certification scheme of the International Electrotechnical Commission.

ISO/IEC RFID Standards Collection on CD-ROM

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(International Organization for Standardization, Geneva) -- ISO has just launched a CD-ROM containing a collection of 24 ISO/IEC standards and

ISO/TS 22003 Aims to Build Confidence in Certification of Food Safety Management Systems

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(International Organization for Standardization-Geneva) -- A newly published document in the ISO 22000 series gives the requirements for the b

Thorny RoHS

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Think Europe’s Restriction of Hazardous Substances (RoHS) was tough? Meet China RoHS.

Collecting Useful Data

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How do we conclude that a nagging, recurring blip has become serious enough to justify taking action?

An Interplanetary Internet: Going Where No Standards Have Gone Before

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(American National Standards Institute, Washington, D.C.) -- A project underway at the National Aeronautics and Space Administration’s (NASA)

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