(Delcam International Inc.: Windsor, Ontario, Canada) -- Inspection with PowerINSPECT is helping J.P.

Greetings from your new Chairperson! It’s my pleasure to lead the Coordinate Metrology Society (CMS) into a new year.

In just the past two years, the functionality of portable computer-aided metrology system (CAMS) in harsh factory environments has improved a great deal.

Do you know what’s really going on in your overseas partners’ and suppliers’ plants? Are you sure? Many companies are unable to answer with a confident yes. That’s bad news.

(NIST: Gaithersburg, Maryland) -- The lack of common measurement methods among light-emitting diode (LED) and lighting manufacturers has affected the commercialization of solid-state lighting products. In a recent paper, “New Practical Method for Measurement of High-Power LEDs,” Proc.

(NIST: Gaithersburg, Maryland) -- Researchers at the National Institute of Standards and Technology (NIST) have demonstrated their ability to measure relatively low levels of stress or strain in regions of a semiconductor device as small as 10 nanometers across.