This article is about how augmented reality (AR) techniques can change the way we use measurement equipment.

Location, location, location! Last month, a diverse assortment of metrologists, scientists, engineers, quality control specialists, manufacturers, educators, and students streamed into the 2013 Coordinate Metrology Systems Conference (CMSC).

I opened a fortune cookie yesterday, which read “Understanding little is better than misunderstanding a lot.” Seems to me that we lean wannabes misunderstand a lot—maybe not everyone, but I regretfully include myself in that group.