{domain:"www.qualitydigest.com",server:"169.47.211.87"} Skip to main content

        
User account menu
Main navigation
  • Topics
    • Customer Care
    • Regulated Industries
    • Research & Tech
    • Quality Improvement Tools
    • People Management
    • Metrology
    • Manufacturing
    • Roadshow
    • QMS & Standards
    • Statistical Methods
    • Resource Management
  • Videos/Webinars
    • All videos
    • Product Demos
    • Webinars
  • Advertise
    • Advertise
    • Submit B2B Press Release
    • Write for us
  • Metrology Hub
  • Training
  • Subscribe
  • Log in
Mobile Menu
  • Home
  • Topics
    • Customer Care
    • Regulated Industries
    • Research & Tech
    • Quality Improvement Tools
    • People Management
    • Metrology
    • Manufacturing
    • Roadshow
    • QMS & Standards
    • Statistical Methods
    • Supply Chain
    • Resource Management
  • Login / Subscribe
  • More...
    • All Features
    • All News
    • All Videos
    • Training

PI Tackles High-Resolution Focusing Demands in Metrology and Microscopy

Objective focusing stages bring precision where tolerances leave no room for error

Quality Digest
Bio
Wed, 08/05/2026 - 12:02
  • Comment
  • RSS

Social Sharing block

  • Print
Body

(Physik Instrumente: Shrewsbury, MA) -- Physik Instrumente (PI), a global leader in precision motion control, provides new options for objective focusing stage applications.

ADVERTISEMENT

High-speed and high-resolution focusing is critical in wafer inspecting, measuring optical components, or imaging biological samples. Modern microscopes and surface metrology systems routinely operate at magnifications where depth of focus shrinks to just a few micrometers or even less. Under these conditions, even minor variations in sample height, surface topography, thermal drift, or vibration can push the area of interest out of focus, degrading both image quality and measurement accuracy.

Two nanopositioning drive technologies, one goal

PI addresses this challenge with fast, nanoprecision focusing systems built around two complementary drive technologies. The piezo-driven P-725 and voice coil-driven V-308 objective focusing stages can quickly adjust the objective lens position with nanometer-level resolution and millisecond response times, keeping systems locked on target regardless of throughput demands or environmental disturbances.

In optical profilometry and 3D surface metrology, rapid focus scanning enables accurate reconstruction of complex surface features. In automated microscopy, it allows large areas or multiple samples to be inspected at high throughput without sacrificing image sharpness.

Semiconductor inspection: Where speed and precision converge

The demands are particularly stringent in semiconductor inspection, where millions of features must be measured quickly and accurately. Precision objective focusing stages that minimize focus error and reduce settling times directly improve throughput, enhance repeatability, and enable reliable detection of ever-smaller defects and structures. As imaging resolution continues to advance and production volumes grow, fast nanopositioning focus systems have become a critical enabling technology for next-generation metrology and inspection equipment.

Advanced control: The other half of the equation

Achieving nanometer precision in milliseconds requires more than precision mechanics and high-quality sensors. It demands advanced electronics and control algorithms to match. PI offers both benchtop and OEM digital motion controllers with built-in linearization and optimization routines tailored for scanning and fast step-and-settle applications, ensuring that mechanical performance is fully realized in real-world operating conditions.

Industries served and applications:
• Semiconductor inspection
• Metrology
• DNA sequencing
• Microscopy
• Photonics
• Laser processing

Specifications, datasheets:
• Fast Objective Focusing Stages, P-725 / V-308
• Digital Controllers and Drivers

PI objective focusing stages: voice coil (left) for long travel to 7 mm; piezo (right) for compact size and fast response with travel ranges to 800 µm.

Add new comment

The content of this field is kept private and will not be shown publicly.
About text formats
Image CAPTCHA
Enter the characters shown in the image.

© 2026 Quality Digest. Copyright on content held by Quality Digest or by individual authors. Contact Quality Digest for reprint information.
“Quality Digest" is a trademark owned by Quality Circle Institute Inc.

footer
  • Home
  • Print QD: 1995-2008
  • Print QD: 2008-2009
  • Videos
  • Privacy Policy
  • Write for us
footer second menu
  • Subscribe to Quality Digest
  • About Us