(Park Systems: Gwacheon, South Korea) -- Park Systems Corp., a leading provider of atomic force microscopy (AFM) and nanoscale metrology solutions, announced the commercial launch of the Park FX40 IR, completing the company’s Nano-IR spectrometer portfolio with a small-sample platform. The FX40 IR enables researchers to simultaneously acquire nanoscale IR chemical information and surface topography on samples up to 20 mm × 20 mm, identifying molecular composition at sub-5 nm spatial resolution without surface contact.

The FX40 IR follows the 2025 launch of the FX200 IR and FX300 IR, which brought nanoscale IR spectroscopy to large-sample and full wafer-scale configurations, and extends the same capability to small-sample research.

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