(Carl Zeiss Microscopy: Thornwood, NY) -- Carl Zeiss Microscopy LLC is holding two workshop series on its scanning electron microscope (SEM) products. Separate events will be held for the ZEISS Field Emission Scanning Electron Microscope (ΣIGMA, SUPRA, ULTRA, and MERLIN Series), and the EVO Series SEM. Each of these hands-on workshops can be tailored to the particular SEM experience level of participants, and ample time will be given for questions and practice using the participants’ samples.

The FE-SEM Series Workshop covering the ΣIGMA, SUPRA, ULTRA, and MERLIN Series is a two-day workshop that will be held May 21–22, 2013 in California, and Sept. 18-19, 2013, in New York. The workshop includes a review of basic instrument principles, operations, and parameter adjustments; a discussion of the effects of changing parameters on image quality; and an overview of the extensive software features available.

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