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Quantum Study Reveals Potential for Sensing at the Nanoscale

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(ORNL: Oak Ridge, TN) -- A new nanoscience study led by a researcher at the U.S. Department of Energy’s Oak Ridge National Laboratory takes a big-picture look at how scientists study materials at the smallest scales.

Tilted CT Improves X-ray Inspection of Flat Components

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(Nikon Metrology: Brighton, MI) -- A pioneering X-ray computed laminography (CL) technique has been introduced by the Industrial Metrology business unit of Nikon for nondestructively inspecting challenging

DataHow Joins the Tetra Partner Network

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(TetraScience: Boston) -- TetraScience, the scientific data cloud company, announced a partnership with DataHow, a provider of a digital bioprocess development platform, to help customers transform bioprocess design and optimization using Tetra Data—the life science industry’s only AI-ready scien

Key Technology Introduces COMPASS Optical Sorters

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Signalysis and MECALC Technologies Partnership Expands Product Quality Testing

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(Signalysis: Cincinnati) -- Signalysis Inc., a leading provider of end-of-production quality test systems, has announced a partnership with hardware supplier MECALC.

DeltaTrak FlashTrak Global Supply Chain Management System Ready for Sweden

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(DeltaTrak: Modesto, CA) -- Sweden can now rely on the patented

Equatic’s Transformative Technology Enables Seawater to Capture and Store Carbon

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(Equatic: Los Angeles) -- Carbon removal company 

U.S. 300 mm Chip Manufacturer Selects EAGLEi 300 FOUP Inspection Technology for Production

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(SHELLBACK Semiconductor Technology: Coopersburg, PA) -- SHELLBACK Semiconductor Technology, at the forefront of supplying capital equipment solutions to emerging semiconductor markets worldwide, has sold its popular EAGLEi 300 FOUP inspection system to a major 300 mm chip manufacturer in the U.S

Mecmesin Expands OmniTest UTM Range

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Mettler Toledo Presents New Product Inspection Systems

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