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Product News: Four-Axis Microgage Receiver

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(Pinpoint Laser Systems: Peabody, MA) -- Pinpoint Laser Systems is introducing a new four-axis microgage receiver that provides useful alignment information for evaluating and correcting machinery alignment problems.

Machine Vision in Europe Returns to Growth

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(EMVA: Munich) -- During a press conference at AUTOMATICA 2010, European Machine Vision Association (EMVA) Vice President Cor Maas noted, “The European machine vision industry is well on track to return to substantial growth this year.

3-D Scanners Prove Useful in Product Liability Cases

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(NVision: Coppell, TX) -- Materials Analysis Inc., a Dallas engineering firm specializing in litigation support, is using noncontact 3-D scanning to provide critical assistance in product liability cases.

Product News: Keithley 2015 Total Harmonic Distortion Multimeter

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(Advanced Test Equipment Rentals: San Diego) -- Advanced Test Equipment Rentals, a provider of electronic test and measurement equipment rentals, is pleased to announce immediate availability of the

Product News: GAGEtrak Calibration Management Software

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(Cybermetrics Corp.: Phoenix) -- The Bosch Group is a global supplier of technology and services for automotive and industrial technology, consumer goods, and building technology.

Bangladesh’s New Metrology Lab Strengthens Country’s Industrial Base

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(UNIDO: Vienna) -- Kandeh K. Yumkella, director-general of the United Nations Industrial Development Organization (UNIDO), says that Bangladesh has the potential to become the metrology hub of South Asia.

“Dark Pulse” Laser Produces Bursts of… Almost Nothing

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(NIST: Gaithersburg, MD) -- In an advance that sounds almost Zen, researchers at the National Institute of Standards and Technology (NIST) and JILA, a joint institute of NIST and the University of Colorado at Boulder, have demonstrated a new type of pulsed laser that excels at not produ

Product News: OIM 6.0 Electron Backscatter Diffraction Software

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(EDAX Inc.: Mahwah, NJ) -- EDAX Inc., part of AMETEK Inc.’s Material Analysis Division, a provider of X-ray microanalysis and electron diffraction instrumentation, continues to lead the industry with its recent release of OIM 6.0.

Vision Show Attendance Doubled from 2009

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(AIA: Ann Arbor, Michigan) -- The Vision Show, held in Boston, May 25–27, had double the attendees of 2009’s show and conference. The positive response to the show and conference parallel the recovery of the market and growth in the industries that are seeking vision and imaging solutions.

Webinar: Noncontact, 3-D Optical Surface Profilometry

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(Veeco Instruments Inc.: Plainview, NY) -- As part of its ongoing series of live webinars on 3-D, noncontact surface profilometry, Veeco Instruments Inc.

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