Capture Software Expands Laser Microgage Uses
(Pinpoint Laser Systems: Peabody, MA) -- Pinpoint Laser Systems is introducing a new data interface accessory called Capture for the popular Laser Microgage industrial measuring and alignment system.
Automated Optical Emission and XRF Spectrometers Speed Workflow
(Thermo Fisher Scientific: Ecublens, Switzerland) -- Thermo Fisher Scientific Inc., a world leader in serving science, announces a new and powerful addition to its range of automated optical emission and X-ray fluorescence spectrometers.
New Solutions Brochure Available for Plastics Testing
(Instron: Norwood, MA) -- Instron, a leading provider of testing equipment solutions designed to evaluate mechanical properties of materials and components, announces the new “Pla
M-Series Embedded Vision System Now Supports PoE
(PPT VISION: Bloomington, MN) -- PPT VISION’s recently released IMPACT M-Series Embedded Vision System features power over Ethernet (PoE) support, delivering network reliability and simplifying the installation and maintenance of networked devices.
Larger Brinell Hardness Test Blocks Mean Fewer Reorders
(Wilson Hardness: Norwood, MA) -- Wilson Hardness, an Instron company and the originator of the Rockwell Hardness Tester, announces the release of its new
JRC 3-D Reconstructor and FaroArm Just Released
(Gexcel: Brescia, Italy) -- FARO, a global provider of portable measurement and imaging solutions, and Gexcel, a software and solutions provider in the geomatics sector, announce the release of the JRC 3-D Reconstructor and FaroArm, a Gexcel software solution fully optimized for the FARO Laser S
Sphere Fit Extension Sticks to Task
(Hubbs Machine & Manufacturing: Cedar Hill, MO) -- Introduced as a new Hubbs product at the 2010 CMSC in July, 2010, the Sphere Fit Extension (SFX) efficiently provides only the necessary geometric features required for use in a sphere fit hidden-point routine—and nothing more.
Book: <em>Handbook of Surface and Nanometrology, Second Edition</em>
(CRC Press: Boca Raton, FL) -- Miniaturization and nanotechnology have become inextricably linked to traditional surface geometry and metrology.
Two New Temperature Calibrators Available
(AMETEK: Largo, FL) -- AMETEK Test & Calibration Instruments, a leader in temperature calibration, has added the JOFRA RTC-158 and RTC-250 to its line of advanced dry-block reference temperature calibrators. Both calibrators offer a host of innovative features.
Workshops Scheduled for Stress-Analysis Techniques
(Micro-Measurements: Raleigh, NC) -- Vishay Precision Group Inc. (VPG) has announced its Micro-Measurements Division’s U.S. training session schedule for the first half of 2011.