(Heidenhain: Schaumburg, IL) -- Heidenhain Corp. has announced the latest version of it's PC-based QUADRA-CHEK Metrology software, which provides advanced functionality for inspection measurement machines.

(Delcam: Birmingham, UK) -- Delcam will demonstrate the latest developments in its CADCAM products at WESTEC, Booth No. 2812, March 27–29, 2012, at the Los Angeles Convention Center in Los Angeles, California.

(Fixlogix: Olivet, MI) -- Developing CMM fixtures for flexible plastic parts or thin-walled stampings has always been challenging. This is especially true if the call-out is for the part to be inspected in an unconstrained condition.

(MSC: Irvine, CA) -- The Measurement Science Conference (MSC) 2012 will focus on the future of measurement science and the challenges that we face moving into the future.

(Kistler: Novi, MI) -- Kistler, a worldwide supplier of precision sensors, systems, and instrumentation for the dynamic measurement of pressure, force, torque, and acceleration, has introduced additional measuring ranges of 15 kN and 5 kN for its Type 2160A NC electromechanical joining modules.

(Steinbichler: Plymouth, MI) -- Steinbichler, a global supplier of optical measuring and sensor technology, presents integrated photogrammetry for the overall acquisition of 3-D reference points, with which complex 3-D digitalization projects can now be handled even more efficiently.

(Konica Minolta: Ramsey, NJ) -- Konica Minolta Sensing Americas Inc.

(Lumetrics: Rochester, NY) -- Lumetrics, a leading manufacturer of world-class precision thickness measurement technology, has installed an OptiGauge at Direct Flow Medical to enable design and manufacture of new cardiovascular products.

(San Dimas, CA) -- CRAIC Technologies, a global leader in application-focused microanalysis solutions, has launched the-CRAIC MP-2 microscope photometer.

(NPL: Teddington, Middlesex, UK) -- New research by the United Kingdom’s National Physical Laboratory (NPL), and the Scottish Universities Environmental Research Centre (SUERC) will improve the accuracy of estimates of the time of geological events.