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Nikon Metrology Opens New Tech Center in North America

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(Nikon: Brighton, MI) -- More than 100 metrology and manufacturing professionals gathered to visit the new Nikon Metrology Inc. Technology Center, located at the company’s headquarters for the Americas in Brighton, Michigan.

Main Propulsion Shaft Inspection System to Save Navy $10.8 Million

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(Concurrent Technologies: Johnstown, PA) -- In an effort to save costs in ship construction and maintenance, the Navy Metalworking Center (NMC) is conducting a Navy ManTech project that is developing a prototype system for inspecting tapers

Vision Slide Eliminates Use of Clay as Source of Fixture Allocation

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(CMM Dynamics: Apollo, PA) -- CMM Dynamics Inc., a leader in the precision fixture design and manufacturing industry, has designed and patented a precision universal fixture, the Vision Slide, which will reform the methodologies of fixture setup allocation on vision systems.

Teledyne DALSA Launches BOA Pro for Industrial Inspection

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(Teledyne DALSA: Waterloo, Ontario) -- Teledyne DALSA, a Teledyne Technologies company and global leader in machine vision technology, has launched its new BOA Pro smart camera.

Automated Balloon and Tubing Measurement for Medical Industry

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(Lumetrics: Rochester, NY) -- Lumetrics, a leading manufacturer of measurement technology, began shipment of its latest innovation, the LumetriScan 360, a fully automated, noncontact thickness measurement system for the medical industry.

A CMM with Nanometer Uncertainty for a Micro Price

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(TriNano: Eindhoven, the Netherlands) -- TriNano is a new nano/micro coordinate measuring machine (CMM) for measuring objects with submillimeter features in 3-D and with nanometer uncertainty.

HALCON 10: A Powerful Tool for Medical Image Analysis

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(MVTec: Munich, Germany) -- As part of the “Medical Discovery Tour” at VISION 2011, scheduled for Nov.

Hexagon Webinar on PC-DMIS 2011 MR1

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(Hexagon: North Kingstown, RI) -- Hexagon Metrology is offering a free live webinar about the release of PC-DMIS 2011 MR1, to be held on Thurs., Oct. 27, 2011, from 11:30 a.m. to 12 p.m. Eastern Daylight Time.

National Instruments to Host Measurement and Control Technical Symposiums

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(National Instruments: Austin, TX) -- National Instruments (NI) has opened registration for the 2011 NI Technical Symposium, a series of daylong events that showcase the latest NI technologies and development techniques for engineers an

Spectro Launches Next-Generation Spectro xSORT

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(AMETEK: Kleve, Germany) -- SPECTRO Analytical Instruments, a unit of AMETEK Materials Analysis Division and a leading supplier of analytical instruments for optical emission and XRF spectrometry, has introduced the next-generation SPECTRO xSORT handheld energy-dispersive X-ray fluorescence (

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