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Mobile Surface Roughness Measurement for Production Lines

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(Jenoptik: Jena, Germany) -- Light and compact in design, easy to operate with long-lasting battery power, the Hommel-Etamic W5 surface roughness measuring system is ideally suited for measurements on the production line.

Software Development Kit for FD-Series Spectrodensitometers

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(Konica Minolta: Ramsey, NJ) -- Konica Minolta Sensing Americas Inc. (KMSA), the worldwide leader in the industrial measurement of color, light, and shape, announces the release of its Software Development Kit (SDK) for the recently introduced FD-Series spectrodensitometers.

Versatile SR200 Surface Roughness Tester Introduced

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(L.S. Starrett: Athol, MA) -- The SR200 Surface Roughness Tester from The L.S. Starrett Co.

Radian Laser Tracker with INNOVO Technology Released

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(API: Rockville, MD) -- Automated Precision Inc. (API) has released its Radian Laser Tracker with the INNOVO Technology Platform. This new and advanced laser tracker changes the way that people use laser trackers.

Breakthrough Indentation Yield <br>Strength Test

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(Nanovea: Irvine, CA) -- Nanovea has introduced its patent-pending breakthrough method of reliably acquiring yield strength through indentation, which should replace the traditional tensile testing machine for yield strength measurement.

Flatness and Leveling Measuring System with Auto-Rotating Laser

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(LUDECA: Doral, FL) -- LEVALIGN EXPERT provides an accurate and easy-to-use method for the measurement of split machine casings, the flatness and straightness of machine bases and foundations, and the flatness and parallelism of circular, rectangular, and odd-shaped flanges.

Accurate Weighing of Bulk Materials Using XP Microbalance Sieve Analysis

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(Mettler-Toledo: Greifensee, Switzerland) -- Determining the size of particles is becoming increasingly important. If the particle distribution changes during the manufacturing process, then the quality of the finished product will also change.

Twin ARTEMIS Probes to Study Moon in 3-D

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(UC Berkeley: Berkeley, CA) -- On Sunday, July 17, the moon acquired two new companions in less than a month.

CMSC 2011 Rounds Out Conference With Exciting Special Events

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(CMSC: Benbrook, TX) -- The Coordinate Metrology Society (CMS) has announced its final schedule of events for the 27th annual Coordinate Metrology Systems Conference (CMSC) scheduled for July 25–29, 2011, at the Arizona Biltmore Hotel and Spa in Phoenix, Arizona.

Convince 2011 3-D Scanning and Quality Control System

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(3Shape: Copenhagen, Denmark) -- 3Shape, a global leader in 3-D scanners and CAD/CAM software solutions, has launched its latest Convince 2011 3-D Scanning and Quality Control system, a comprehensive solution for 3-D digitization and quality control of small, detail-rich objects.

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