(Artel: Westbrook, ME) -- Artel, a global leader in liquid handling quality assurance, will present a workshop providing guidance on validation and optimization for the Tecan Freedom EVO Liquid Handling platform. This workshop, which will be held Jan.

(Johnson Gage: Bloomfield, CT) -- As a part of its continuing commitment to the aerospace and defense market, The Johnson Gage Co. will feature its industry standard and time-tested Thread Inspection Systems as well as a broad spectrum of new products in booth No.

(Indicate Technologies Inc.: Santa Clara, CA) -- The Applied Dimensional Metrology Workshop to be held Feb.

(Vision Engineering: Surrey, United Kingdom) -- Vision Engineering Ltd.’s Falcon incorporates more than 50 years of optical experience in a high-accuracy, three-axi

(Process Sensors Corp.: Franklin Lakes, NJ) -- Process Sensor Corp., a manufacturer and distributor of noncontact infrared temperature and moisture measurement instruments, announces its high-accuracy bench-type blackbody calibration source, design model BBS 1150, that features high emissivity o

(Konica Minolta: Ramsey, NJ) -- Konica Minolta Sensing Americas Inc. (KMSA), a global leader in the industrial measurement of color, light, and shape, announces the U.S.

(Mettler-Toledo Inc.: Greifensee, Switzerland) -- Mettler-Toledo has announced an upcoming webinar in collaboration with Dionex Corp. that will describe a unique, automated approach to linearity testing to shorten workflow and reduce error rate.

(Measurement Systems International: Seattle, WA) -- A chemical processing facility wanted to integrate data from a crane scale to its programmable logic controller (PLC) system and structured query language (SQL) server.

For website owners and bloggers, there is a new widget from the National Institute of Standards and Technology (NIST) that will keep web pages right on time.

(Capture 3D: Costa Mesa, CA) -- Capture 3D has released the GOM ATOS Triple Scan series of 3-D scanners incorporating blue LED light-source technology and new pattern projection techniques.