(Nikon Metrology NV: Brighton, MI)—Nikon Metrology NV, a subsidiary of Nikon Corp., announces the launch of Scatter Correction CT, a software solution designed to address the challenges posed by X-ray scatter artifacts in industrial computed tomography (CT) scanning. By employing advanced physics-based modeling techniques, Scatter Correction CT significantly improves image clarity and measurement accuracy, particularly for dense materials such as aluminum, steel, ceramic, and Inconel. 

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