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Leica Geosystems’ Fifth Generation Laser Tracker Defines “What’s Next” in Portable Metrology
(Hexagon Metrology: Miamisburg, Ohio) -- Leica Geosystems, a Hexagon company, recently unveiled the new face of laser tracking—the Leica Absolute Tracker. The all-new laser tracker offers scaled-up features in a scaled-down, sleek housing for ultimate portability, and ease of handling on the…
Geomagic Qualify 10 Demonstrated at CMSC 2008
(Geomagic: Research Triangle Park, North Carolina) -- Geomagic will demonstrate Geomagic Qualify 10, new computer-aided inspection software for users of multisensor metrology systems, at CMSC 2008 in Charlotte, North Carolina. Geomagic is exhibiting in booth No. 308. Geomagic Qualify 10…
Creaform becomes Dassault Systèmes’ Education Partner
(Creaform: Lévis, Quebec, Canada) -- After entering Dassault Systèmes’ CAA program and becoming value-added reseller (VAR) in 2007, Creaform has now been certified for DS’s well-known Education Partner Program (EPP). Companies with the EPP label can deliver up-to-date and consistent education…
Sokkia Introduces Automated 3D Station NET05
(Sokkia Corp.: Olathe, Kansas) -- Sokkia is pleased to introduce the release of the Automated 3D Station NET05 offering the industry’s highest accuracy for industrial, construction and deformation monitoring applications. SOKKIA has been providing NET-series high precision 3D Stations for use in…
Verisurf Software Appoints Gabriel Draguicevich to Regional Manager for the South-Central United States
(Verisurf Software Inc.: Anaheim, California) -- Verisurf Software Inc. is maintaining its strong growth strategy to expand the company’s presence in the United States by appointing Gabriel Draguicevich as their new regional manager for the South-Central United States. He will be building upon…
Metrologic Group Acquires Majority Stake in ATT Metrology Services
(Metrologic Group: Grenoble, France) -- Metrologic Group has acquired a majority stake in ATT Metrology Services Inc., a large-scale 3-D metrology inspection company. The acquisition is part of Metrologic Group’s growth strategy aimed at adding 3-D industrial inspection services to its…
NIST Micro Sensor and Micro Fridge Make Cool Pair
Colorized micrograph of a NIST chip combining four microrefrigerators (circled in red) with a superconducting sensor (large orange square in the middle). The self-cooling chip could be used for applications ranging from detailed X-ray analysis of semiconductors to detection of…
Latest Vision Market Trends and Forecasts
(Automated Imaging Association: Ann Arbor, Michigan) -- A new machine vision market study reports that machine vision and automated imaging continues to be a growth industry in North America. The 2008 study is based on 2007 actual results and is organized primarily around the major machine…
Carl Zeiss MicroImaging Named as Supplier for David H. Murdock Research Institute
(Carl Zeiss MicroImaging: Thornwood, NY) --The David H. Murdock Research Institute (DHMRI) in Kannapolis, North Carolina, has chosen Carl Zeiss MicroImaging, to supply its light microscopy and biological imaging systems for the microscopy core facility, making it one of the most advanced…
Microstamping Analysis Enhanced By Confocal Microscopy
This image shows how a microstamped primer on a cartridge casing is visualized using the Olympus LEXT platform. The image highlights the benefits of analysis and visualization using Confocal microscopy. Seen here are increases in resolution, depth of focus and contrast…
24th Coordinate Metrology Systems Conference
(Coordinate Metrology Society: Concord, North Carolina) -- The Coordinate Metrology Society, a membership association for measurement professionals, will host its 24th Annual Coordinate Metrology Systems Conference (CMSC) 2008 from July 21–25, 2008 at the new Embassy Suites overlooking Lowes…
Tracking Nanoparticles in 3-D
Heart of the orthogonal tracking microscope system developed at NIST is this nanoparticle solution sample well etched in silicon. Careful orientation of the silicon crystal makes it possible to chemically etch angled sides in the well so smooth they act as mirrors. In this…
Enabling Double-Patterning Lithography
(Carl Zeiss SMT: Albany, New York; and SEMATECH: Austin, Texas) -- In a potential boost to advance lithography, engineers at SEMATECH and Carl Zeiss SMT have announced the completion of their final design for the next generation photomask registration and overlay metrology system—called PROVE.…
Redefining the Kilogram
Hy Tran examines a kilogram sample in a mass comparator at Sandia’s Primary Standards Laboratory. Photo by Randy Montoya   (Sandia Corp.: Albuquerque, New Mexico) -- The kilogram is losing weight and many international scientists, including some at Sandia…
Humid Environment Ideal for Accurate and Precise Pipetting
(ARTEL: New Orleans, Louisiana) -- The ARTEL Extreme Pipetting Expedition has announced data showing that pipettes performed accurately and precisely in Washington state’s humid Olympic National Park, but underdelivered significantly in a drier facility mimicking typical laboratory conditions…
Geomagic Studio 10 Now Shipping
(Geomagic: Research Triangle Park, North Carolina) -- Geomagic is now shipping Geomagic Studio 10, the latest version of its digital reconstruction software, and offering a free 90-day trial through it’s web site, www.geomagic.com.Geomagic Studio 10 features an optional surfacing module called…
Audi Partners with Delcam
(Delcam plc: Birmingham, United Kingdom) -- Software from Delcam and support from AZtech have helped VMP Team Audi to a successful season.VMP Team Audi has entered into a partnership with Delcam’s South African reseller AZtech covering the supply of software, hardware, and support. Following…
Multi Metrics Launches SmartGD&T Machine Shop Partner Program
(Multi Metrics Inc.: Menlo Park, California) -- Multi Metrics Inc., a global provider of geometric dimensioning and tolerancing (GD&T) technology, training, and support, recently announced the launch of its SmartGD&T Machine Shop Partner Program, delivering affordable, on-demand, GD…
PolyWorks 10.1 Offers Major Sheet Metal Workflow Enhancements
(InnovMetric Software Inc.: Quebec, Province of Quebec, Canada) -- InnovMetric Software Inc. released an intermediate version of PolyWorks, its universal metrology software platform, in November 2007. With PolyWorks 10.1, InnovMetric significantly increases the productivity of its sheet metal…
Metris Acquires Industrial CT Company X-Tek
(Metris: Leuven, Belgium) -- Metris has recently announced that it has signed a share purchase agreement with the shareholders of X-Tek Group for the purchase of 100 percent of the X-Tek stock. The X-Tek purchase fits in the Metris acquisition strategy to strengthen its product portfolio with…
Metronor’s Next-Generation Boresight System to Replace Hawk Legacy Boresight System
(Metronor AS: Nesbru, Norway) -- BAE Systems has awarded Metronor AS an additional Harmolign boresight system contract. The contract covers development and supply of a new configuration of the Harmolign boresight system for BAE Systems’ Hawk jet trainer. The system will replace a legacy…
API Launches New Measurement Services Company
(API Technical Services LLC: Newport News, Virginia) -- API Technical Services LLC is pleased to announce that it has formally started operations as of January 2008. API Technical Services is a new metrology services company, wholly owned by Automated Precision Inc. (API) and is based in Newport…
New ISO/IEC Guide to Metrology Vocabulary
(ISO: Geneva) -- The International Organization for Standardization and its partner, the International Electrotechnical Commission, have published a new guide on the vocabulary of metrology—the science of measurement and its application.ISO/IEC Guide 99:2007, “International vocabulary of…
EOS International User Meeting
(EOS: Krailling, Germany) -- EOS, a manufacturer of laser-sintering systems, has announced that the 11th EOS International User Meeting (IUM) will be held April 14–16 at the hotel The Monarch hotel in Bad Goegging, Germany. The annual conference provides participants with a platform for…
ISO/IEC Guide Metrology Published
(ISO: Geneva) -- The International Organization for Standardization and its partner International Electrotechnical Commission have published a new guide on the vocabulary of metrology, the science of measurement and its application.ISO/IEC Guide 99:2007—“International vocabulary of metrology—Basic…

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