All News
(National Instruments: Austin, TX) -- National Instruments (NI) recently announced four new R Series multifunction reconfigurable input/output (RIO) boards for PCI Express that give engineers and scientists the benefits of field-programmable gate array (FPGA) technology in a widely adopted form…
(Veriteq: Vancouver, BC, Canada) -- Veriteq Instruments recently announced the release of their new viewLinc monitoring and alarming system for regulated controlled environments. The viewLinc 3.4 validatable system provides continuous, gap-free records and automates the generation and delivery of…
(Marposs Corp.: Auburn Hills, MI) -- Marposs Corp. will introduce the i-Wave, its newest wireless device in the M1 Star bore gauge product line, at Quality Expo 2009 in booth 4739, Sept. 22–24, in Rosemont, Illinois. The i-Wave wireless handle allows quick and easy plug-and-play changeover of a…
(ASD: Birmingham, MI) -- ASD’s GageMux USB simplifies and streamlines data collection. Specifically developed to keep on the cutting edge of technology, the new GageMux USB multiple input gauge interface now has three user selectable outputs of backward compatibility and environmentally friendly…
(Promess Inc.: Brighton, MI) -- Promess Inc. has added a series of hollow-shaft units to its line of Torque Functional Test (TFT) Systems intended for intelligent assembly applications. Based on direct drive rotary motor technology, the new TFT-HS series permits users to access components with…
(Quality Digest: Louisville, KY) -- As first reported in the July 17th issue of Quality Digest Daily, Hexagon Metrology has filed patent infringement litigation against Metris N.V. and its U.S. subsidiary Metris U.S.A. Inc. The basis of that lawsuit, according to court documents obtained by…
(Hexagon Metrology Inc.: North Kingstown, RI) -- Hexagon Metrology Inc., on July 21 at the Coordinate Metrology Systems Conference (CMSC) in Louisville, Kentucky, announced the North American debut of the new Leica TDRA6000 Total Station, the most accurate Leica Geosystems total station ever…
(Lattice Technology Inc.: San Francisco) -- Lattice Technology, developers of digital manufacturing applications using the extensible virtual world description language (XVL) format, today announced Version 6.0 of its XVL Converter applications, delivering the tools to convert 3-D CAD data into…
(Quality Digest: Louisville, KY) -- Real-time 3-D capture and comparison to a CAD model—on a moving part—generated some excitement at the CMSC show when Creaform demonstrated the capabilities of its HandyPROBE 3-D probing system running with Verisurf software.
The HandyPROBE is a wireless…
(Aven Inc.: Ann Arbor, MI)—Digital microscope users gain all-in-one convenience from the first integrated systems that combine image capture, measurement, annotation, and networking capability without external software or hardware.
The iVue and iScope from the SharpVue division of Aven Inc.…
(Agilent Technologies Inc.: Santa Clara, CA) -- Agilent Technologies recently introduced Agilent Functional Verification Service (FVS) for users of Agilent gas chromatographs (GC) or liquid chromatographs (LC) that are seeking or maintaining accreditation under ISO/IEC 17025 or similar quality…
(NVision Inc.: Coppell, TX) -- NVision Inc. and FixLogix LLC have partnered to provide a new easy-to-use and economical modular part-holding system designed especially for noncontact scanning. The FixLogix part-holding system uses a T-slot fixture plate with integrated components to stage the part…
(The QC Group: Burnsville, MN) -- On July 16, The QC Group launched an Instant-Quote site for scanning and comparative analysis services for precision products. This e-commerce solution is the first of its kind in the industry, allowing a client to obtain an instant quote for comparing first…
(Wilcox Associates: North Kingstown, RI) -- Wilcox Associates, a Hexagon Metrology company, has released PC-DMIS Vision 2009. It includes a patented MultiCapture feature that typically improves measurement productivity by 35 percent (and more when the part is densely populated with features that…
(Metrologic Group: Wixom, MI) -- The new Metrologic V5 Inspection suite is now available on CATIA V5 R19SP3 level. This new version includes many new functionalities and capabilities and is now compatible with a multitude of devices: DCC CMM, portable arms, laser trackers, photogrammetry systems…
(Sciemetric Instruments: Ottawa) -- Sciemetric Instruments, a provider of manufacturing quality control technology, is pleased to announce the newest addition to the sigPOD family of products.
sigPOD PSV is an out-of-the-box, user-configurable solution that can be used to test or monitor…
(Hexagon Metrology: London) -- Hexagon Metrology has filed a patent infringement suit in U.S. District Court in Massachusetts alleging that Metris N.V. and its U.S. subsidiary Metris U.S.A. Inc., and Mitutoyo Corporation and its U.S. subsidiary Mitutoyo America Corporation, have infringed U.S.…
(Tohnichi Manufacturing Co.: Northbrook, IL) -- Tohnichi introduces a digital version of its popular TG torque gauge series. This new compact handheld torque gauge features a unique all-in-one digital display and three-fingered keyless chuck design—no external display required.
Ideal for…
(ASTM International: West Conshohocken, PA) -- Localized corrosion, such as pitting, cracking, or crevice corrosion, can be destructive to process equipment, but if it is detected early enough, potential damage can be minimized or avoided.
A new ASTM International standard provides a means for…
The Coordinate Metrology Systems Conference (CMSC) is next week, July 20–24. There is no event in the United States better situated to communicate the value and return on investment of large scale 3-D metrology than the CMSC. This year’s CMSC, its 25th, will be held in Louisville, Kentucky. It is…
(Paul N. Gardner Company Inc.: Pompano Beach, FL) -- The Novo-Gloss I.Q. is the first hand-held instrument to profile how light is reflected from a surface. Traditional glossmeters measure quantitatively and aren't sensitive to effects that reduce appearance quality. The Novo-Gloss I.Q. uses…
(Olympus: Center Valley, Pa.) -- Process engineers, fab managers, professionals in yield enhancement, process development, and failure analysis will benefit from the newly introduced Olympus defect inspection and review system, the company’s fast and accurate semiconductor defect review solution.…
(Georgia Institute of Technology: Atlanta) -- A new statistical analysis technique that identifies and removes systematic bias, noise, and equipment-based artifacts from experimental data could lead to more precise and reliable measurement of nanomaterials and nanostructures likely to have future…
(UL: Northbrook, IL) -- Underwriters Laboratories (UL), a provider of safety testing and certification, recently announced the completion of its photovoltaic testing facility expansion in San Jose, California. The expansion has increased testing capacity by more than 40 percent, making it the…
(Delcam: Birmingham, UK) -- Delcam has launched its own online TV channel, Delcam TV, on www.delcam.tv. Delcam is believed to be the first CADCAM company to invest significantly in this new marketing medium.
Customer testimonials are featured covering design, manufacturing, and inspection…
