(Nikon Metrology NV: Leuven, Belgium) -- Nikon Metrology NV announces the compact, yet versatile, XT V 130 X-ray inspection system that efficiently traces failures inside complex electronic devices and multilayer circuit boards.

To maintain highest quality standards in an environment of continuous miniaturization, electronics manufacturers prefer deploying intuitive, reliable, and efficient X-ray imaging capability in-house.

The XT V 130 is a compact and affordable X-ray system for automated quality assurance on serial-produced electronic samples. The XT V 130 inspection system will be demonstrated in a premiere at the Productronica show in Munich (Nov. 10–13).

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